Controlled crack propagation for atomic precision handling of wafer-scale two-dimensional materials

Press/Media: Press / Media

Period	2018 Nov 8

Title	Controlled crack propagation for atomic precision handling of wafer-scale two-dimensional materials
Media name/outlet	Science Magazine
Country	United States
Date	18/11/8
URL	ct.moreover.com/?a=37633558669&p=1gw&v=1&x=dO6jpnBlxIzBG-d0Er412Q
Persons	Jong-Hyun Ahn, Hyun Seo Ahn