Media coverage
1
Media coverage
Title Defect States Determining Dynamic Trapping-Detrapping in {beta}-Ga2O3 Field-Effect Transistors Media name/outlet ECS Journal of Solid State Science and Technology Country United States Date 19/1/16 URL jss.ecsdl.org/cgi/content/short/8/7/Q3013?rss=1 Persons Jihyun F. Kim