Defect States Determining Dynamic Trapping-Detrapping in {beta}-Ga2O3 Field-Effect Transistors

Press/Media: Press / Media

Period	2019 Jan 16

Media coverage

Title	Defect States Determining Dynamic Trapping-Detrapping in {beta}-Ga2O3 Field-Effect Transistors
Media name/outlet	ECS Journal of Solid State Science and Technology
Country	United States
Date	19/1/16
URL	jss.ecsdl.org/cgi/content/short/8/7/Q3013?rss=1
Persons	Jihyun F. Kim