Defect States Determining Dynamic Trapping-Detrapping in {beta}-Ga2O3 Field-Effect Transistors

Press/Media: Press / Media

Period	2019 Jan 16

Title	Defect States Determining Dynamic Trapping-Detrapping in {beta}-Ga2O3 Field-Effect Transistors
Media name/outlet	ECS Journal of Solid State Science and Technology
Country	United States
Date	19/1/16
URL	ct.moreover.com/?a=38264583031&p=1gw&v=1&x=5c1tMqguu4zrzO-bdFP_YQ
Persons	Jihyun F. Kim