Electronics and Telecommunications Research Institute Granted United States Patent for High Reliability Field Effect Power Device and Manufacturing Method Thereof

Press/Media: Press / Media

Period2017 Oct 3

Media coverage

1

Media coverage

  • TitleElectronics and Telecommunications Research Institute Granted United States Patent for High Reliability Field Effect Power Device and Manufacturing Method Thereof
    Media name/outletGlobal IP News. Electrical Patent News
    Country/TerritoryIndia
    Date17/10/3
    Personsminjung Kim
View all 1
View less