Investigators at Yonsei University Discuss Findings in Mathematics (Commonality Analysis for Detecting Failures Caused By Inspection Tools In Semiconductor Manufacturing Processes)

Press/Media: Press / Media

Period	2022 Dec 7

Media coverage

Title	Investigators at Yonsei University Discuss Findings in Mathematics (Commonality Analysis for Detecting Failures Caused By Inspection Tools In Semiconductor Manufacturing Processes)
Media name/outlet	South Korea Daily Report
Country/Territory	United States
Date	22/12/7
URL	ct.moreover.com/?a=49449495758&p=1gw&v=1&x=0Avmp98O_JDBXar80UwoFg
Persons	Seung Hyun Kim, Chang Ouk Kim