Postech Academy-Industry Foundation Obtains Patent for Apparatus for Electrodeless Measurement of Electron Mobility in Nano Material, Apparatus for Electrodeless Measurement of Hole Mobility in Nano Material, Method for Electrodeless Measurement of Electr

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Period2022 Feb 9

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  • TitlePostech Academy-Industry Foundation Obtains Patent for Apparatus for Electrodeless Measurement of Electron Mobility in Nano Material, Apparatus for Electrodeless Measurement of Hole Mobility in Nano Material, Method for Electrodeless Measurement of Electr
    Media name/outletGlobal IP News. Measurement & Testing Patent News
    Country/TerritoryIndia
    Date22/2/9
    PersonsHyun Jae Kim
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