Samsung Electronics Seeks Patent for Method of Testing an Interconnection Substrate and Apparatus for Performing the Same

Press/Media: Press / Media

Period2020 May 28

Media coverage

1

Media coverage

  • TitleSamsung Electronics Seeks Patent for Method of Testing an Interconnection Substrate and Apparatus for Performing the Same
    Media name/outletGlobal IP News. Semiconductor Patent News
    CountryIndia
    Date20/5/28
    PersonsHyun Jae Kim