US Patent Issued to SAMSUNG ELECTRONICS on April 7 for "Method of measuring clock jitter, clock jitter measurement circuit, and semiconductor devices including the same" (South Korean Inventors)

Press/Media: Press / Media

Period2020 Apr 10

Media coverage

1

Media coverage

  • TitleUS Patent Issued to SAMSUNG ELECTRONICS on April 7 for "Method of measuring clock jitter, clock jitter measurement circuit, and semiconductor devices including the same" (South Korean Inventors)
    Media name/outletUS Fed News
    CountryUnited States
    Date20/4/10
    PersonsHyun Jae Kim