US Patent Issued to SAMSUNG ELECTRONICS on April 7 for "Method of measuring clock jitter, clock jitter measurement circuit, and semiconductor devices including the same" (South Korean Inventors)

Media coverage

• Title	US Patent Issued to SAMSUNG ELECTRONICS on April 7 for "Method of measuring clock jitter, clock jitter measurement circuit, and semiconductor devices including the same" (South Korean Inventors)
  Media name/outlet	US Fed News
  Country/Territory	United States
  Date	20/4/10
  Persons	Hyun Jae Kim