US Patent Issued to SAMSUNG ELECTRONICS on June 15 for "Signal transfer structure for test equipment and automatic test apparatus for testing semiconductor devices using the same" (South Korean Inventors)

Press/Media: Press / Media

Period2021 Jun 16

Media coverage

1

Media coverage

  • TitleUS Patent Issued to SAMSUNG ELECTRONICS on June 15 for "Signal transfer structure for test equipment and automatic test apparatus for testing semiconductor devices using the same" (South Korean Inventors)
    Media name/outletUS Fed News
    Country/TerritoryUnited States
    Date21/6/16
    PersonsHyun Jae Kim