US Patent Issued to UIF (University Industry Foundation), Yonsei University on Jan. 31 for "Scan apparatus capable of fault diagnosis and scan chain fault diagnosis method" (South Korean Inventors)

Media coverage

• Title	US Patent Issued to UIF (University Industry Foundation), Yonsei University on Jan. 31 for "Scan apparatus capable of fault diagnosis and scan chain fault diagnosis method" (South Korean Inventors)
  Media name/outlet	US Fed News
  Country/Territory	United States
  Date	23/2/1
  URL	ct.moreover.com/?a=49893470336&p=1gw&v=1&x=SeT-DfgtjvShFGJDqYAm4g
  Persons	Sungho Kang