US Patent Issued to YONSEI UNIVERSITY INDUSTRY FOUNDATION (YONSEI UIF), INTEKPLUS on Nov. 24 for "Fluorescence lifetime measurement apparatus and method capable of finding two or more fluorescence lifetime components by computing least square error throug

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Period2020 Nov 25

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  • TitleUS Patent Issued to YONSEI UNIVERSITY INDUSTRY FOUNDATION (YONSEI UIF), INTEKPLUS on Nov. 24 for "Fluorescence lifetime measurement apparatus and method capable of finding two or more fluorescence lifetime components by computing least square error throug
    Media name/outletUS Fed News
    CountryUnited States
    Date20/11/25
    PersonsYoungKeun Kim, YoungWan Kim
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