US Patent Issued to YONSEI UNIVERSITY INDUSTRY FOUNDATION (YONSEI UIF), INTEKPLUS on March 22 for "Fluorescence lifetime measurement device for analyzing multi-exponential decay function type experimental data at high speed and measurement method therefor

Press/Media: Press / Media

Period2022 Mar 22

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  • TitleUS Patent Issued to YONSEI UNIVERSITY INDUSTRY FOUNDATION (YONSEI UIF), INTEKPLUS on March 22 for "Fluorescence lifetime measurement device for analyzing multi-exponential decay function type experimental data at high speed and measurement method therefor
    Media name/outletUS Fed News
    Country/TerritoryUnited States
    Date22/3/22
    PersonsYoungWan Kim