Yonsei University Industry Foundation and INTEKPLUS Co Ltd File United States Patent Application for Fluorescence Lifetime Measurement Device for Analyzing Multi-Exponential Decay Function Type Experimental Data at High Speed and Measurement Method Theref

Press/Media: Press / Media

Period2020 Mar 20

Media coverage

1

Media coverage

  • TitleYonsei University Industry Foundation and INTEKPLUS Co Ltd File United States Patent Application for Fluorescence Lifetime Measurement Device for Analyzing Multi-Exponential Decay Function Type Experimental Data at High Speed and Measurement Method Theref
    Media name/outletGlobal IP News. Measurement & Testing Patent News
    CountryIndia
    Date20/3/20
    PersonsSang-Hyoun Kim