Yonsei University Industry Foundation (Yonsei Uif) and Intekplus Co Ltd Awarded Patent for Fluorescence Lifetime Measurement Device for Analyzing Multi-Exponential Decay Function Type Experimental Data at High Speed and Measurement Method Therefor

Press/Media: Press / Media

Period2022 Mar 23

Media coverage

1

Media coverage

  • TitleYonsei University Industry Foundation (Yonsei Uif) and Intekplus Co Ltd Awarded Patent for Fluorescence Lifetime Measurement Device for Analyzing Multi-Exponential Decay Function Type Experimental Data at High Speed and Measurement Method Therefor
    Media name/outletGlobal IP News. Chemical Patent News
    Country/TerritoryIndia
    Date22/3/23
    PersonsSang-Hyoun Kim