Yonsei University Industry Foundation (Yonsei Uif) and Intekplus Co Ltd Awarded Patent for Fluorescence Lifetime Measurement Device for Analyzing Multi-Exponential Decay Function Type Experimental Data at High Speed and Measurement Method Therefor

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Period2022 Mar 23

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  • TitleYonsei University Industry Foundation (Yonsei Uif) and Intekplus Co Ltd Awarded Patent for Fluorescence Lifetime Measurement Device for Analyzing Multi-Exponential Decay Function Type Experimental Data at High Speed and Measurement Method Therefor
    Media name/outletGlobal IP News. Chemical Patent News
    Country/TerritoryIndia
    Date22/3/23
    PersonsSang-Hyoun Kim
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