School of Integrated Technology

Organization profile

Organisation profile

글로벌융합공학부

Fingerprint Dive into the research topics where School of Integrated Technology is active. These topic labels come from the works of this organisation's members. Together they form a unique fingerprint.

Thin film transistors Engineering & Materials Science
Communication Engineering & Materials Science
transistors Physics & Astronomy
Light emitting diodes Engineering & Materials Science
Substrates Engineering & Materials Science
Metals Chemical Compounds
Oxide films Engineering & Materials Science
Temperature Engineering & Materials Science

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Research Output 1991 2020

Improved dielectric properties of BeO thin films grown by plasma enhanced atomic layer deposition

Jang, Y., Lee, S. M., Jung, D. H., Yum, J. H., Larsen, E. S., Bielawski, C. W. & Oh, J., 2020 Jan, In : Solid-State Electronics. 163, 107661.

Research output: Contribution to journalArticle

beryllium oxides
Beryllia
Atomic layer deposition
atomic layer epitaxy
Dielectric properties

Improved reduction of contact resistance in NiSi/Si junction using Holmium interlayer

Eadi, S. B., Song, H. S., Song, H. D., Oh, J. & Lee, H. D., 2020 Jan 15, In : Microelectronic Engineering. 219, 111153.

Research output: Contribution to journalArticle

Holmium
holmium
Contact resistance
contact resistance
interlayers

A field of view based metal artifact reduction method with the presence of data truncation

Choi, S., Moon, S. & Baek, J., 2019 Jan 1, 15th International Meeting on Fully Three-Dimensional Image Reconstruction in Radiology and Nuclear Medicine. Matej, S. & Metzler, S. D. (eds.). SPIE, 110722S. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 11072).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Reduction Method
Field of View
Truncation
field of view
artifacts