• 1029 Citations
  • 17 h-Index
19972019
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Fingerprint Dive into the research topics where Chang Ouk Kim is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

  • 8 Similar Profiles
Supply chains Engineering & Materials Science
Fault detection Engineering & Materials Science
Inventory control Engineering & Materials Science
Neural networks Engineering & Materials Science
Scheduling Engineering & Materials Science
Experiments Engineering & Materials Science
Radio frequency identification (RFID) Engineering & Materials Science
Semiconductor materials Engineering & Materials Science

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Research Output 1997 2019

Adaptive Weapon-to-Target Assignment Model Based on the Real-Time Prediction of Hit Probability

Jang, J., Yoon, H. G., Kim, J. C. & Kim, C. O., 2019 Jan 1, In : IEEE Access. 7, p. 72210-72220 11 p., 8725473.

Research output: Contribution to journalArticle

Open Access
Ballistic missiles
Radar
Launching
Missiles
Learning systems

Agent simulation-based ordinal optimisation for new product design

Lee, H., Lim, J., Lee, K. & Kim, C. O., 2019 Mar 4, In : Journal of the Operational Research Society. 70, 3, p. 502-515 14 p.

Research output: Contribution to journalArticle

Product design
Sales
Specifications
Smartphones
Industry

Automatic inspection of salt-and-pepper defects in OLED panels using image processing and control chart techniques

Kwak, J., Lee, K. B., Jang, J., Chang, K. S. & Kim, C. O., 2019 Mar 15, In : Journal of Intelligent Manufacturing. 30, 3, p. 1047-1055 9 p.

Research output: Contribution to journalArticle

Organic light emitting diodes (OLED)
Image processing
Inspection
Pixels
Salts

Convolutional Neural Network for Wafer Surface Defect Classification and the Detection of Unknown Defect Class

Cheon, S., Lee, H., Kim, C. O. & Lee, S. H., 2019 May 1, In : IEEE Transactions on Semiconductor Manufacturing. 32, 2, p. 163-170 8 p., 8657760.

Research output: Contribution to journalArticle

Surface defects
surface defects
wafers
Neural networks
Defects

Denoised Residual Trace Analysis for Monitoring Semiconductor Process Faults

Jang, J., Min, B. W. & Kim, C. O., 2019 Aug 1, In : IEEE Transactions on Semiconductor Manufacturing. 32, 3, p. 293-301 9 p., 8713521.

Research output: Contribution to journalArticle

Trace analysis
Fault detection
fault detection
wafers
Semiconductor materials