• 3823 Citations
  • 31 h-Index
19962020

Research output per year

If you made any changes in Pure these will be visible here soon.

Personal profile

Research interests

Phase transition / Carrier transport under pahse tranistion / Defect analysis/new memory/

Research interests

Phase transition / Carrier transport under pahse tranistion / Defect analysis/new memory/

Fingerprint Dive into the research topics where Mann-Ho Cho is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

  • 14 Similar Profiles

Network Recent external collaboration on country level. Dive into details by clicking on the dots.

Research Output

Phase-change properties related to anharmonicity of local structure

Ahn, M., Jeong, K. S., Park, S., Jung, H., Han, J., Yang, W., Kim, D., Park, J. & Cho, M. H., 2020 Jun, In : Current Applied Physics. 20, 6, p. 807-816 10 p.

Research output: Contribution to journalArticle

  • Quantification of point and line defects in Si0.6Ge0.4 alloys with thickness variation via optical pump-THz probe measurement

    Kim, J., Jeong, K., Baik, M., Kim, D. K., Chae, J., Park, H., Hong, S. B., Ko, D. H. & Cho, M. H., 2020 May 30, In : Applied Surface Science. 513, 145815.

    Research output: Contribution to journalArticle

  • Topological Phase Control of Surface States in Bi2Se3 via Spin-Orbit Coupling Modulation through Interface Engineering between HfO2- X

    Jeong, K., Park, H., Chae, J., Sim, K. I., Yang, W. J., Kim, J. H., Hong, S. B., Kim, J. H. & Cho, M. H., 2020 Mar 11, In : ACS Applied Materials and Interfaces. 12, 10, p. 12215-12226 12 p.

    Research output: Contribution to journalArticle

  • Closing the surface bandgap in thin Bi2Se3/Graphene heterostructures

    Chae, J., Kang, S. H., Park, S. H., Park, H., Jeong, K., Kim, T. H., Hong, S. B., Kim, K. S., Kwon, Y. K., Kim, J. W. & Cho, M. H., 2019 Apr 23, In : ACS Nano. 13, 4, p. 3931-3939 9 p.

    Research output: Contribution to journalArticle

  • 4 Citations (Scopus)

    Effects of thermal and electrical stress on defect generation in InAs metal–oxide–semiconductor capacitor

    Baik, M., Kang, H. K., Kang, Y. S., Jeong, K. S., Lee, C., Kim, H., Song, J. D. & Cho, M. H., 2019 Feb 15, In : Applied Surface Science. 467-468, p. 1161-1169 9 p.

    Research output: Contribution to journalArticle

  • 3 Citations (Scopus)