• 1019 Citations
  • 14 h-Index
1989 …2019
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Fingerprint Dive into the research topics where Sungho Kang is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

  • 7 Similar Profiles
Data storage equipment Engineering & Materials Science
Built-in self test Engineering & Materials Science
Redundancy Engineering & Materials Science
Testing Engineering & Materials Science
Repair Engineering & Materials Science
Hardware Engineering & Materials Science
Networks (circuits) Engineering & Materials Science
Data compression Engineering & Materials Science

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Research Output 1989 2019

2-D Failure Bitmap Compression Using Line Fault Marking Method

Cho, K., Lee, Y. W., Seo, S. & Kang, S., 2019 Feb 22, Proceedings - International SoC Design Conference 2018, ISOCC 2018. Institute of Electrical and Electronics Engineers Inc., p. 21-22 2 p. 8649886. (Proceedings - International SoC Design Conference 2018, ISOCC 2018).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Data storage equipment
Redundancy
Testing
Costs

3D Memory Formed of Unrepairable Memory Dice and Spare Layer

Han, D., Lee, H., Lee, S., Moon, M. & Kang, S., 2019 Feb 22, Proceedings of TENCON 2018 - 2018 IEEE Region 10 Conference. Institute of Electrical and Electronics Engineers Inc., p. 1362-1366 5 p. 8650278. (IEEE Region 10 Annual International Conference, Proceedings/TENCON; vol. 2018-October).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Data storage equipment
Repair
Productivity

A Software-based Scan Chain Diagnosis for Double Faults in A Scan Chain

Lim, H., Jang, S. & Kang, S., 2019 Feb 22, Proceedings - International SoC Design Conference 2018, ISOCC 2018. Institute of Electrical and Electronics Engineers Inc., p. 265-266 2 p. 8649930. (Proceedings - International SoC Design Conference 2018, ISOCC 2018).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Networks (circuits)

A Test Methodology for Neural Computing Unit

Cheong, M., Lee, I. & Kang, S., 2019 Feb 22, Proceedings - International SoC Design Conference 2018, ISOCC 2018. Institute of Electrical and Electronics Engineers Inc., p. 11-12 2 p. 8649896. (Proceedings - International SoC Design Conference 2018, ISOCC 2018).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Neural networks
Particle accelerators
Testing
Deep learning

Dynamic voltage Drop induced Path Delay Analysis for STV and NTV Circuits during At-speed Scan Test

Oh, H., Kim, H., Lee, S. & Kang, S., 2019 Feb 22, Proceedings - International SoC Design Conference 2018, ISOCC 2018. Institute of Electrical and Electronics Engineers Inc., p. 7-8 2 p. 8649911. (Proceedings - International SoC Design Conference 2018, ISOCC 2018).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Networks (circuits)
Energy efficiency
Voltage drop