• 1159 Citations
  • 15 h-Index
1989 …2020

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2019

2-D Failure Bitmap Compression Using Line Fault Marking Method

Cho, K., Lee, Y. W., Seo, S. & Kang, S., 2019 Feb 22, Proceedings - International SoC Design Conference 2018, ISOCC 2018. Institute of Electrical and Electronics Engineers Inc., p. 21-22 2 p. 8649886. (Proceedings - International SoC Design Conference 2018, ISOCC 2018).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3D Memory Formed of Unrepairable Memory Dice and Spare Layer

Han, D., Lee, H., Lee, S., Moon, M. & Kang, S., 2019 Feb 22, Proceedings of TENCON 2018 - 2018 IEEE Region 10 Conference. Institute of Electrical and Electronics Engineers Inc., p. 1362-1366 5 p. 8650278. (IEEE Region 10 Annual International Conference, Proceedings/TENCON; vol. 2018-October).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

An Efficient Scan Chain Diagnosis for Stuck-at and Transition Faults

Lim, H., Jang, S., Kim, S. & Kang, S., 2019 Oct, Proceedings - 2019 International SoC Design Conference, ISOCC 2019. Institute of Electrical and Electronics Engineers Inc., p. 295-296 2 p. 9078517. (Proceedings - 2019 International SoC Design Conference, ISOCC 2019; vol. 2019-January).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

A Software-based Scan Chain Diagnosis for Double Faults in A Scan Chain

Lim, H., Jang, S. & Kang, S., 2019 Feb 22, Proceedings - International SoC Design Conference 2018, ISOCC 2018. Institute of Electrical and Electronics Engineers Inc., p. 265-266 2 p. 8649930. (Proceedings - International SoC Design Conference 2018, ISOCC 2018).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

A Test Methodology for Neural Computing Unit

Cheong, M., Lee, I. & Kang, S., 2019 Feb 22, Proceedings - International SoC Design Conference 2018, ISOCC 2018. Institute of Electrical and Electronics Engineers Inc., p. 11-12 2 p. 8649896. (Proceedings - International SoC Design Conference 2018, ISOCC 2018).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Dynamic voltage Drop induced Path Delay Analysis for STV and NTV Circuits during At-speed Scan Test

Oh, H., Kim, H., Lee, S. & Kang, S., 2019 Feb 22, Proceedings - International SoC Design Conference 2018, ISOCC 2018. Institute of Electrical and Electronics Engineers Inc., p. 7-8 2 p. 8649911. (Proceedings - International SoC Design Conference 2018, ISOCC 2018).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Low Power Scan Chain Architecture Based on Circuit Topology

Kim, H., Oh, H., Lee, S. & Kang, S., 2019 Feb 22, Proceedings - International SoC Design Conference 2018, ISOCC 2018. Institute of Electrical and Electronics Engineers Inc., p. 267-268 2 p. 8649956. (Proceedings - International SoC Design Conference 2018, ISOCC 2018).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Neural Network Reliability Enhancement Approach Using Dropout Underutilization in GPU

Lee, D., Lim, H., Kim, T. H. & Kang, S., 2019 Feb 22, Proceedings of TENCON 2018 - 2018 IEEE Region 10 Conference. Institute of Electrical and Electronics Engineers Inc., p. 2281-2286 6 p. 8650184. (IEEE Region 10 Annual International Conference, Proceedings/TENCON; vol. 2018-October).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2018

An efficient built-in self-repair scheme for area reduction

Cho, K., Lee, Y. W., Seo, S. & Kang, S., 2018 May 29, Proceedings - International SoC Design Conference 2017, ISOCC 2017. Institute of Electrical and Electronics Engineers Inc., p. 105-106 2 p. (Proceedings - International SoC Design Conference 2017, ISOCC 2017).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

A new repair scheme for TSV-based 3D memory using base die repair cells

Han, D., Lee, H., Kim, D. & Kang, S., 2018 May 29, Proceedings - International SoC Design Conference 2017, ISOCC 2017. Institute of Electrical and Electronics Engineers Inc., p. 11-12 2 p. (Proceedings - International SoC Design Conference 2017, ISOCC 2017).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

A selective error data capture method using on-chip DRAM for silicon debug of multi-core design

Oh, H., Kim, H., Lim, J. & Kang, S., 2018 May 29, Proceedings - International SoC Design Conference 2017, ISOCC 2017. Institute of Electrical and Electronics Engineers Inc., p. 121-122 2 p. (Proceedings - International SoC Design Conference 2017, ISOCC 2017).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

LARECD: Low area overhead and reliable error correction DMR architecture

Lim, H., Kim, T., Lee, D. & Kang, S., 2018 May 29, Proceedings - International SoC Design Conference 2017, ISOCC 2017. Institute of Electrical and Electronics Engineers Inc., p. 27-28 2 p. (Proceedings - International SoC Design Conference 2017, ISOCC 2017).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Test data reduction method based on berlekamp-massey algorithm

Lim, H., Kim, J., Kang, S. & Kang, S., 2018 May 29, Proceedings - International SoC Design Conference 2017, ISOCC 2017. Institute of Electrical and Electronics Engineers Inc., p. 123-124 2 p. (Proceedings - International SoC Design Conference 2017, ISOCC 2017).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2017

A new online test and debug methodology for automotive camera image processing system

Oh, H., Choi, I. & Kang, S., 2017 Jan 3, 2016 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2016. Institute of Electrical and Electronics Engineers Inc., p. 370-371 2 p. 7803978. (2016 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2016).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Broadcast scan compression based on deterministic pattern generation algorithm

Lim, H., Seo, S., Kang, S. & Kang, S., 2017 May 2, Proceedings of the 18th International Symposium on Quality Electronic Design, ISQED 2017. IEEE Computer Society, p. 449-453 5 p. 7918357. (Proceedings - International Symposium on Quality Electronic Design, ISQED).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Off-chip test architecture for improving multi-site testing efficiency using tri-state decoder and 3V-level encoder

Seo, S., Lim, H., Kang, S. & Kang, S., 2017 May 2, Proceedings of the 18th International Symposium on Quality Electronic Design, ISQED 2017. IEEE Computer Society, p. 191-195 5 p. 7918315. (Proceedings - International Symposium on Quality Electronic Design, ISQED).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Test access mechaism for stack test time reduction of 3-dimensional integrated circuit

Choi, I., Oh, H. & Kang, S., 2017 Jan 3, 2016 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2016. Institute of Electrical and Electronics Engineers Inc., p. 522-525 4 p. 7804019. (2016 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2016).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Test item priority estimation for high parallel test efficiency under ATE debug time constraints

Lee, Y. W., Choi, I., Oh, K. H., Ko, J. J. & Kang, S., 2017 Nov 3, ITC-Asia 2017 - International Test Conference in Asia. Institute of Electrical and Electronics Engineers Inc., p. 150-154 5 p. 8097131. (ITC-Asia 2017 - International Test Conference in Asia).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2016

A 2-D compaction method using macro block for post-silicon validation

Jung, W., Oh, H., Kang, D. & Kang, S., 2016 Feb 8, ISOCC 2015 - International SoC Design Conference: SoC for Internet of Everything (IoE). Institute of Electrical and Electronics Engineers Inc., p. 41-42 2 p. 7401690. (ISOCC 2015 - International SoC Design Conference: SoC for Internet of Everything (IoE)).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

A new built-in redundancy analysis algorithm based on multiple memory blocks

Kim, J., Cho, K., Lee, W. & Kang, S., 2016 Feb 8, ISOCC 2015 - International SoC Design Conference: SoC for Internet of Everything (IoE). Institute of Electrical and Electronics Engineers Inc., p. 43-44 2 p. 7401691. (ISOCC 2015 - International SoC Design Conference: SoC for Internet of Everything (IoE)).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

A new in-field bad block detection scheme for NAND flash chips

Kang, D., Cho, K. & Kang, S., 2016 Feb 8, ISOCC 2015 - International SoC Design Conference: SoC for Internet of Everything (IoE). Institute of Electrical and Electronics Engineers Inc., p. 69-70 2 p. 7401657. (ISOCC 2015 - International SoC Design Conference: SoC for Internet of Everything (IoE)).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

A scan segment skip technique for low power test

Lee, H., Lee, J., Lim, H. & Kang, S., 2016 Feb 8, ISOCC 2015 - International SoC Design Conference: SoC for Internet of Everything (IoE). Institute of Electrical and Electronics Engineers Inc., p. 127-128 2 p. 7401669. (ISOCC 2015 - International SoC Design Conference: SoC for Internet of Everything (IoE)).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

A test methodology to screen scan-path failures

Kim, J., Lee, Y. W., Cheong, M., Seo, S. & Kang, S., 2016 Dec 27, ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things. Institute of Electrical and Electronics Engineers Inc., p. 149-150 2 p. 7799831. (ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

A TSV test structure for simultaneously detecting resistive open and bridge defects in 3D-ICs

Lee, Y. W., Kim, J., Choi, I. & Kang, S., 2016 Dec 27, ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things. Institute of Electrical and Electronics Engineers Inc., p. 129-130 2 p. 7799724. (ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Discussion of cost-effective redundancy architectures

Cho, K., Kim, J., Lee, H. & Kang, S., 2016 Dec 27, ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things. Institute of Electrical and Electronics Engineers Inc., p. 97-98 2 p. 7799751. (ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Failure bitmap compression method for 3D-IC redundancy analysis

Cho, K., Lee, W., Kim, J. & Kang, S., 2016 Feb 8, ISOCC 2015 - International SoC Design Conference: SoC for Internet of Everything (IoE). Institute of Electrical and Electronics Engineers Inc., p. 335-336 2 p. 7401724. (ISOCC 2015 - International SoC Design Conference: SoC for Internet of Everything (IoE)).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

P-Backtracking: A new scan chain diagnosis method with probability

Kim, T. H., Liin, H. Y. & Kang, S., 2016 Dec 27, ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things. Institute of Electrical and Electronics Engineers Inc., p. 141-142 2 p. 7799827. (ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Process variation-Aware bridge fault analysis

Kim, H., Choi, I., Lim, J., Oh, H. & Kang, S., 2016 Dec 27, ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things. Institute of Electrical and Electronics Engineers Inc., p. 147-148 2 p. 7799830. (ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Software-based embedded core test using multi-polynomial for test data reduction

Kang, S., Choi, I., Lim, H., Seo, S. & Kang, S., 2016 Dec 27, ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things. Institute of Electrical and Electronics Engineers Inc., p. 39-40 2 p. 7799762. (ISOCC 2016 - International SoC Design Conference: Smart SoC for Intelligent Things).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2015

A new redundancy analysis algorithm using one side pivot

Kim, J., Cho, K., Lee, W. & Kang, S., 2015 Apr 16, ISOCC 2014 - International SoC Design Conference. Institute of Electrical and Electronics Engineers Inc., p. 134-135 2 p. 7087609. (ISOCC 2014 - International SoC Design Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

An online test and debug methodology for automotive image processing system

Oh, H., Choi, I., Han, T., Jung, W., Moon, B. & Kang, S., 2015 Apr 16, ISOCC 2014 - International SoC Design Conference. Institute of Electrical and Electronics Engineers Inc., p. 226-227 2 p. 7087618. (ISOCC 2014 - International SoC Design Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

A scan shifting method based on clock gating of multiple groups for low power scan testing

Seo, S., Lee, Y., Lee, J. & Kang, S., 2015 Apr 13, Proceedings of the 16th International Symposium on Quality Electronic Design, ISQED 2015. IEEE Computer Society, p. 162-166 5 p. 7085417. (Proceedings - International Symposium on Quality Electronic Design, ISQED; vol. 2015-April).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

11 Citations (Scopus)

Low power scan bypass technique with test data reduction

Lim, H., Kang, W., Seo, S., Lee, Y. & Kang, S., 2015 Apr 13, Proceedings of the 16th International Symposium on Quality Electronic Design, ISQED 2015. IEEE Computer Society, p. 173-176 4 p. 7085419. (Proceedings - International Symposium on Quality Electronic Design, ISQED; vol. 2015-April).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Near optimal repair rate built-in redundancy analysis with very small hardware overhead

Lee, W., Cho, K., Kim, J. & Kang, S., 2015 Apr 13, Proceedings of the 16th International Symposium on Quality Electronic Design, ISQED 2015. IEEE Computer Society, p. 435-439 5 p. 7085465. (Proceedings - International Symposium on Quality Electronic Design, ISQED; vol. 2015-April).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Reducing the failure bitmap size with a partial solution search tree for the low cost automatic test equipment (ATE)

Cho, K., Lee, W., Kim, J. & Kang, S., 2015 Apr 16, ISOCC 2014 - International SoC Design Conference. Institute of Electrical and Electronics Engineers Inc., p. 128-129 2 p. 7087606. (ISOCC 2014 - International SoC Design Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Scan cell reordering algorithm for low power consumption during scan-based testing

Kang, W., Lim, H. & Kang, S., 2015 Apr 16, ISOCC 2014 - International SoC Design Conference. Institute of Electrical and Electronics Engineers Inc., p. 300-301 2 p. 7087659. (ISOCC 2014 - International SoC Design Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Scan Chain Reordering-Aware X-Filling and Stitching for Scan Shift Power Reduction

Seo, S., Lee, Y., Lim, H., Lee, J., Yoo, H., Kim, Y. & Kang, S., 2015 Feb 28, Proceedings - 2015 24th IEEE Asian Test Symposium, ATS 2015. IEEE Computer Society, p. 1-6 6 p. 7422226. (Proceedings of the Asian Test Symposium; vol. 2016-February).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Citations (Scopus)
2014

A scalable and parallel test access strategy for NoC-based multicore system

Han, T., Choi, I., Oh, H. & Kang, S., 2014 Dec 7, Proceedings - 23rd Asian Test Symposium, ATS 2014. IEEE Computer Society, p. 81-86 6 p. 06979081. (Proceedings of the Asian Test Symposium).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

10 Citations (Scopus)
2013

An efficient RPCT (Reduced Pin Count Testing) based on test data compression using burst clock controller in 3D-IC

Lee, Y., Seo, S. & Kang, S., 2013, ISOCC 2013 - 2013 International SoC Design Conference. IEEE Computer Society, p. 176-179 4 p. 6863965. (ISOCC 2013 - 2013 International SoC Design Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

A new TSV set architecture for high reliability

Park, J. & Kang, S., 2013, Proceedings of the 5th Asia Symposium on Quality Electronic Design, ASQED 2013. IEEE Computer Society, p. 123-126 4 p. 6643574. (Proceedings of the 5th Asia Symposium on Quality Electronic Design, ASQED 2013).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Bit transmission error correction scheme for FlexRay based automotive communication systems

Choi, I., Han, T. & Kang, S., 2013, 2013 IEEE 2nd Global Conference on Consumer Electronics, GCCE 2013. p. 488-490 3 p. 6664898. (2013 IEEE 2nd Global Conference on Consumer Electronics, GCCE 2013).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Efficient TSV repair method for 3D memories

Kim, I., Cho, K. & Kang, S., 2013, ISOCC 2013 - 2013 International SoC Design Conference. IEEE Computer Society, p. 17-18 2 p. 6863974. (ISOCC 2013 - 2013 International SoC Design Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Scan chain swapping using TSVs for test power reduction in 3D-IC

Lee, I., Park, J. & Kang, S., 2013, ISOCC 2013 - 2013 International SoC Design Conference. IEEE Computer Society, p. 170-171 2 p. 6863963. (ISOCC 2013 - 2013 International SoC Design Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Test scheduling using Ant Colony Optimization for 3D integrated circuits

Choi, I., Han, T. & Kang, S., 2013, ISOCC 2013 - 2013 International SoC Design Conference. IEEE Computer Society, p. 15-16 2 p. 6863973. (ISOCC 2013 - 2013 International SoC Design Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2012

Integration of dual channel timing formatter system for high speed memory test equipment

Park, J., Lee, I., Park, Y. S., Kim, S. G., Ryu, K. H., Jung, D. H., Jo, K., Lee, C. K., Yoon, H., Jung, S. O., Choi, W. Y. & Kang, S., 2012, ISOCC 2012 - 2012 International SoC Design Conference. p. 185-187 3 p. 6407070. (ISOCC 2012 - 2012 International SoC Design Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Process variation-aware floorplanning for 3D many-core processors

Hong, H., Lim, J. & Kang, S., 2012, 2012 IEEE Electrical Design of Advanced Packaging and Systems Symposium, EDAPS 2012. p. 193-196 4 p. 6469421. (2012 IEEE Electrical Design of Advanced Packaging and Systems Symposium, EDAPS 2012).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)
2011

A low-cost DDEM ADC structure for the testing of high-performance DACs

Jang, J., Kim, I., Son, H. & Kang, S., 2011, 54th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2011. 6026360. (Midwest Symposium on Circuits and Systems).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

A new static test of a DAC with a built-in structure

Kim, I., Jang, J., Son, H. & Kang, S., 2011, 54th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2011. 6026361. (Midwest Symposium on Circuits and Systems).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

New fault detection algorithm for multi-level cell flash memories

Cha, J., Kim, I. & Kang, S., 2011, Proceedings of the 20th Asian Test Symposium, ATS 2011. p. 341-346 6 p. 6114753. (Proceedings of the Asian Test Symposium).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Path search engine for fast optimal path search using efficient hardware architecture

Choi, I., Han, T., Kim, I. & Kang, S., 2011 Dec 1, 2011 International SoC Design Conference, ISOCC 2011. p. 96-99 4 p. (2011 International SoC Design Conference, ISOCC 2011).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)