• Source: Scopus
  • Calculated based on no. of publications stored in Pure and citations from Scopus
1989 …2020

Research activity per year

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  • 1991

    AFMG: Automatic functional model generation system for digital simulation

    Han, C. H., Kang, S. & Szygenda, S. A., 1991, Fourth Annual IEEE International ASIC Conference and Exhibit. Publ by IEEE, p. P12-2.1-P12-2.4 (Fourth Annual IEEE International ASIC Conference and Exhibit).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    3 Citations (Scopus)
  • MOVE: Model verification system

    Kang, S. & Szygenda, S. A., 1991 Mar, Conference Proceedings - Annual Phoenix Conference. Publ by IEEE, p. 762-768 7 p. (Conference Proceedings - Annual Phoenix Conference).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • 1992

    Automatic error pattern generation for design error detection in a design validation simulation system

    Kang, S. & Szygenda, S. A., 1992, Proceedings - 5th Annual IEEE International ASIC Conference and Exhibit, ASIC 1992. IEEE Computer Society, p. 533-536 4 p. 270205. (Proceedings of International Conference on ASIC).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • New design error modeling and metrics for design validation

    Kang, S. & Szygenda, S. A., 1992, European Design Automation Conference. Publ by IEEE, p. 472-477 6 p. (European Design Automation Conference).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    5 Citations (Scopus)
  • 1999

    Dynamic power supply current test for CMOS SRAM

    Yoon, D. H., Kim, H. S. & Kang, S., 1999, ICVC 1999 - 6th International Conference on VLSI and CAD. Institute of Electrical and Electronics Engineers Inc., p. 399-402 4 p. 820944. (ICVC 1999 - 6th International Conference on VLSI and CAD).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    8 Citations (Scopus)
  • New scan design of asynchronous sequential circuits

    Kang, Y. S., Huh, K. H. & Kang, S., 1999, AP-ASIC 1999 - 1st IEEE Asia Pacific Conference on ASICs. Institute of Electrical and Electronics Engineers Inc., p. 355-358 4 p. 824102. (AP-ASIC 1999 - 1st IEEE Asia Pacific Conference on ASICs).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    12 Citations (Scopus)
  • 2000

    A 0.35-μm CMOS low noise VGA

    Chung, K., Han, G. & Kang, S., 2000, Proceedings of the 2nd IEEE Asia Pacific Conference on ASICs, AP-ASIC 2000. Institute of Electrical and Electronics Engineers Inc., p. 5-8 4 p. 896894. (Proceedings of the 2nd IEEE Asia Pacific Conference on ASICs, AP-ASIC 2000).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Citation (Scopus)
  • Testability strategy and DFT methodology of CalmRISC32

    Kim, H. S., Seo, I. S., Kang, S. & Han, G., 2000, Proceedings of the 2nd IEEE Asia Pacific Conference on ASICs, AP-ASIC 2000. Institute of Electrical and Electronics Engineers Inc., p. 295-298 4 p. 896966. (Proceedings of the 2nd IEEE Asia Pacific Conference on ASICs, AP-ASIC 2000).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • Test methodology for low power SRAM's (Is Iddq test useful for low power SRAM's?)

    Suh, I., Kim, H. S., Kang, S. & Han, G., 2000, Proceedings of the 2nd IEEE Asia Pacific Conference on ASICs, AP-ASIC 2000. Institute of Electrical and Electronics Engineers Inc., p. 277-280 4 p. 896962. (Proceedings of the 2nd IEEE Asia Pacific Conference on ASICs, AP-ASIC 2000).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • 2002

    An efficient on-line monitoring BIST for remote service system

    Bae, S., Song, D., Kim, J. & Kang, S., 2002, Advanced Internet Services and Applications - 1st International Workshop, AISA 2002, Proceedings. Chang, W. (ed.). Springer Verlag, p. 205-213 9 p. (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); vol. 2402).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • A new DSP architecture for correcting errors using viterbi algorithm

    Yoon, S., Kim, S., Oh, J. & Kang, S., 2002, Advanced Internet Services and Applications - 1st International Workshop, AISA 2002, Proceedings. Chang, W. (ed.). Springer Verlag, p. 95-102 8 p. (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); vol. 2402).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • A new survival architecture for network processors

    Bae, S., Seo, D., Kang, G. & Kang, S., 2002, Advanced Internet Services and Applications - 1st International Workshop, AISA 2002, Proceedings. Chang, W. (ed.). Springer Verlag, p. 1-9 9 p. (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); vol. 2402).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • DPSC SRAM transparent test algorithm

    Kim, H. S. & Kang, S., 2002, Proceedings of the 11th Asian Test Symposium, ATS 2002. IEEE Computer Society, p. 145-150 6 p. 1181702. (Proceedings of the Asian Test Symposium; vol. 2002-January).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    5 Citations (Scopus)
  • 2004

    An efficient all-digital built-in self-test for chargepump PLL

    Han, J., Song, D. & Kang, S., 2004, Proceedings of 2004 IEEE Asia-Pacific Conference on Advanced System Integrated Circuits. p. 80-83 4 p. (Proceedings of 2004 IEEE Asia-Pacific Conference on Advanced System Integrated Circuits).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    10 Citations (Scopus)
  • 2005

    A new low power test pattern generator using a transition monitoring window based on BIST architecture

    Kim, Y., Yang, M. H., Lee, Y. & Kang, S., 2005, Proceedings - 14th Asian Test Symposium, ATS 2005. p. 230-235 6 p. 1575434. (Proceedings of the Asian Test Symposium; vol. 2005).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    14 Citations (Scopus)
  • A practical test scheduling using network-based TAM in network on chip architecture

    Ahn, J. H., Moon, B. I. & Kang, S., 2005, Advances in Computer Systems Architecture - 10th Asia-Pacific Conference, ACSAC 2005, Proceedings. Springer Verlag, p. 614-624 11 p. (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); vol. 3740 LNCS).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • Increasing embedding probabilities of RPRPs in RIN based BIST

    Song, D. S. & Kang, S., 2005, Advances in Computer Systems Architecture - 10th Asia-Pacific Conference, ACSAC 2005, Proceedings. p. 600-613 14 p. (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); vol. 3740 LNCS).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • 2006

    An effective test pattern generation for testing signal integrity

    Kim, Y., Yang, M. H., Park, Y., Lee, D. Y. & Kang, S., 2006, Proceedings of the 15th Asian Test Symposium 2006. p. 279-284 6 p. 4030780. (Proceedings of the Asian Test Symposium; vol. 2006).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Citation (Scopus)
  • SoC test scheduling algorithm using ACO-based rectangle packing

    Ahn, J. H. & Kang, S., 2006, Computational Intelligence International Conference on Intelligent Computing, ICIC 2006, Proceedings. Springer Verlag, p. 655-660 6 p. (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); vol. 4114 LNAI - II).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    10 Citations (Scopus)
  • System on a chip implementation of social insect behavior for adaptive network routing

    Ahn, J. H., Kim, H., Moon, B. I. & Kang, S., 2006, Computational Intelligence International Conference on Intelligent Computing, ICIC 2006, Proceedings. Springer Verlag, p. 530-535 6 p. (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); vol. 4114 LNAI - II).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • TOSCA: Total scan power reduction architecture based on pseudo-random built-in self test structure

    Youbean, K., Dongsup, S., Kicheol, K., Incheol, K. & Sungho, K., 2006, Proceedings of the 15th Asian Test Symposium 2006. p. 17-22 6 p. 4030735. (Proceedings of the Asian Test Symposium; vol. 2006).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • 2007

    High-MDSI: A high-level signal integrity fault test pattern generation method for interconnects

    Sunghoon, C., Yongjoon, K. & Sungho, K., 2007, Proceedings of the 16th Asian Test Symposium, ATS 2007. p. 115-118 4 p. 4387994. (Proceedings of the Asian Test Symposium).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    3 Citations (Scopus)
  • Improved reinforcement computing to implement AntNet-based routing using general NPs for ubiquitous environments

    Park, H., Moon, B. I. & Kang, S., 2007, Ubiquitous Convergence Technology - First International Conference, ICUCT 2006, Revised Selected Papers. Springer Verlag, p. 242-251 10 p. (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); vol. 4412 LNCS).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Citation (Scopus)
  • 2008

    A heuristic method to reduce fault candidates for a speedy fault diagnosis

    Cho, H., Lee, J. & Kang, S., 2008, 2008 International SoC Design Conference, ISOCC 2008. p. I200-I203 4815607. (2008 International SoC Design Conference, ISOCC 2008; vol. 1).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • An effective hybrid test data compression method using scan chain compaction and dictionary-based scheme

    Kim, T., Chun, S., Kim, Y., Yang, M. H. & Kang, S., 2008, Proceedings of the 17th Asian Test Symposium, ATS 2008. p. 151-156 6 p. 4711575. (Proceedings of the Asian Test Symposium).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    4 Citations (Scopus)
  • An effective parallel alpg using instruction for high speed memory testing

    Yoon, H., Yang, M. H., Kim, Y., Park, Y., Park, J. & Kang, S., 2008, 2008 International SoC Design Conference, ISOCC 2008. p. I370-I375 4815649. (2008 International SoC Design Conference, ISOCC 2008; vol. 1).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Citation (Scopus)
  • An efficient scan chain diagnosis method using a new symbolic simulation

    Sunghoon, C., Yongjoon, K., Taejin, K. & Sungho, K., 2008, Proceedings - 26th IEEE VLSI Test Symposium, VTS08. p. 73-78 6 p. 4511699. (Proceedings of the IEEE VLSI Test Symposium).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    2 Citations (Scopus)
  • A new low energy BIST using a statistical code

    Chun, S., Kim, T. & Kang, S., 2008, 2008 Asia and South Pacific Design Automation Conference, ASP-DAC. p. 647-652 6 p. 4484031. (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    5 Citations (Scopus)
  • A new wafer level latent defect screening methodology for highly reliable DRAM using a response surface method

    Nam, J., Chun, S., Koo, G., Kim, Y., Moon, B., Lim, J., Joo, J., Kang, S., Kim, H., Shin, K., Kang, K. & Kang, S., 2008, Proceedings - International Test Conference 2008, ITC 2008. 4700632. (Proceedings - International Test Conference).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Citation (Scopus)
  • A prevenient voltage stress test method for high density memory

    Yim, J., Kim, G., Nam, I., Son, S., Lim, J., Lee, H., Kang, S., Kwak, B., Lee, J. & Kang, S., 2008, Proceedings - 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008. p. 516-520 5 p. 4459605. (Proceedings - 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    2 Citations (Scopus)
  • Path delay fault diagnosis using path scoring

    Yoseop, L., Joohwan, L. & Sungho, K., 2008, 2008 International SoC Design Conference, ISOCC 2008. p. II199-II202 4815718. (2008 International SoC Design Conference, ISOCC 2008; vol. 2).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    2 Citations (Scopus)
  • Segmented scan architecture using segment for test cost reduction

    Yang, M. H., Kim, T., Kim, Y. & Kang, S., 2008, 2008 International SoC Design Conference, ISOCC 2008. p. I379-I382 4815651. (2008 International SoC Design Conference, ISOCC 2008; vol. 1).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    6 Citations (Scopus)
  • Variable-length block nine-coded compression technique with huffman codes and symbol merging

    Jang, J., Kim, Y., Kim, K., Kim, I., Son, H. & Kang, S., 2008, 2008 International SoC Design Conference, ISOCC 2008. IEEE Computer Society, p. 210-213 4 p. 4815609. (s2008 International SoC Design Conference, ISOCC 2008; vol. 1).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Citation (Scopus)
  • XPDF-ATPG: An efficient test pattern generation for crosstalk-induced faults

    Chun, S., Kim, Y., Kim, T., Yang, M. H. & Kang, S., 2008, Proceedings of the 17th Asian Test Symposium, ATS 2008. p. 83-88 6 p. 4711563. (Proceedings of the Asian Test Symposium).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    2 Citations (Scopus)
  • 2009

    A BIST architecture for multiple DACs in an LTPS TFT-LCD source driver IC

    Son, H., Jang, J., Kim, Y., Kim, K., Kim, I. & Kang, S., 2009, 2009 International SoC Design Conference, ISOCC 2009. p. 120-123 4 p. 5423890. (2009 International SoC Design Conference, ISOCC 2009).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    2 Citations (Scopus)
  • A hardware-efficent multi-character string matching architecture using brute-force algorithm

    Ahn, S., Hong, H., Kim, H., Ahn, J. H., Baek, D. & Kang, S., 2009, 2009 International SoC Design Conference, ISOCC 2009. p. 464-467 4 p. 5423922. (2009 International SoC Design Conference, ISOCC 2009).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    6 Citations (Scopus)
  • A high-level signal integrity fault model and test methodology for long on-chip interconnections

    Chun, S., Kim, Y., Kim, T. & Kang, S., 2009, Proceedings - 2009 27th IEEE VLSI Test Symposium, VTS 2009. p. 152-157 6 p. 5116626. (Proceedings of the IEEE VLSI Test Symposium).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • An advanced BIRA using parallel sub-analyzers for embedded memories

    Jeong, W., Han, T. & Kang, S., 2009, 2009 International SoC Design Conference, ISOCC 2009. p. 249-252 4 p. 5423810. (2009 International SoC Design Conference, ISOCC 2009).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    5 Citations (Scopus)
  • An ant colony optimization approach for the preference-based shortest path search

    Ok, S. H., Seo, W. J., Ahn, J. H., Kang, S. & Moon, B., 2009, Communication and Networking: International Conference, FGCN/ACN 2009, Held as Part of the Future Generation Information Technology Conference, FGIT 2009, Jeju Island, Korea, December 10-12, 2009. Pro. Slezak, D., Kim, T., Chang, A. C-C., Vasilakos, T., Li, M. & Sakurai, K. (eds.). p. 539-546 8 p. (Communications in Computer and Information Science; vol. 56).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    3 Citations (Scopus)
  • An area-efficient built-in redundancy analysis for embedded memories with optimal repair rate using 2-D redundancy

    Lee, J., Park, K. & Kang, S., 2009, 2009 International SoC Design Conference, ISOCC 2009. p. 353-356 4 p. 5423846. (2009 International SoC Design Conference, ISOCC 2009).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    6 Citations (Scopus)
  • An efficient hardware architecture of the A-star algorithm for the shortest path search engine

    Seo, W. J., Ok, S. H., Ahn, J. H., Kang, S. & Moon, B., 2009, NCM 2009 - 5th International Joint Conference on INC, IMS, and IDC. p. 1499-1502 4 p. 5331336. (NCM 2009 - 5th International Joint Conference on INC, IMS, and IDC).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    20 Citations (Scopus)
  • DFT for achieving hybrid transiton delay fault test with reduced pin count testing

    Son, C., Ahn, S. & Kang, S., 2009, 2009 International SoC Design Conference, ISOCC 2009. p. 128-132 5 p. 5423888. (2009 International SoC Design Conference, ISOCC 2009).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • FPGA-based verification methodology of SoC-type CMOS image signal processor

    Kim, Y., Kim, H. S., Lee, R. & Kang, S., 2009, Proceedings - IEEE International SOC Conference, SOCC 2009. p. 231-234 4 p. 5398051. (Proceedings - IEEE International SOC Conference, SOCC 2009).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Citation (Scopus)
  • 2010

    An area efficient programmable built-in self-test for embedded memories using an extended address counter

    Park, K., Lee, J. & Kang, S., 2010, 2010 International SoC Design Conference, ISOCC 2010. p. 59-62 4 p. 5682974. (2010 International SoC Design Conference, ISOCC 2010).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    4 Citations (Scopus)
  • A new scan slice encoding scheme with flexible code for test data compression

    Lee, K. S., Park, H., Son, H. & Kang, S., 2010, 2010 International SoC Design Conference, ISOCC 2010. p. 217-220 4 p. 5682934. (2010 International SoC Design Conference, ISOCC 2010).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Citation (Scopus)
  • Enhenced redundancy analysis for memories using geometric faults based search tree

    Kang, W., Cho, H. & Kang, S., 2010, 2010 International SoC Design Conference, ISOCC 2010. p. 225-228 4 p. 5682932. (2010 International SoC Design Conference, ISOCC 2010).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • FiX-compact: A new X-tolerant response compaction scheme for fixed unknown logic values

    Park, J. & Kang, S., 2010, 2010 International SoC Design Conference, ISOCC 2010. p. 209-212 4 p. 5682936. (2010 International SoC Design Conference, ISOCC 2010).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • 2011

    A low-cost DDEM ADC structure for the testing of high-performance DACs

    Jang, J., Kim, I., Son, H. & Kang, S., 2011, 54th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2011. 6026360. (Midwest Symposium on Circuits and Systems).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Citation (Scopus)
  • A new static test of a DAC with a built-in structure

    Kim, I., Jang, J., Son, H. & Kang, S., 2011, 54th IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2011. 6026361. (Midwest Symposium on Circuits and Systems).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  • New fault detection algorithm for multi-level cell flash memories

    Cha, J., Kim, I. & Kang, S., 2011, Proceedings of the 20th Asian Test Symposium, ATS 2011. p. 341-346 6 p. 6114753. (Proceedings of the Asian Test Symposium).

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    4 Citations (Scopus)