• 1159 Citations
  • 15 h-Index
1989 …2020

Research output per year

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Research Output

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Conference article
2013

A die selection and matching method with two stages for yield enhancement of 3-D memories

Kang, W., Lee, C., Cho, K. & Kang, S., 2013, In : Proceedings of the Asian Test Symposium. p. 301-306 6 p., 6690658.

Research output: Contribution to journalConference article

3 Citations (Scopus)
2004

An in-order SMT architecture with static resource partitioning for consumer applications

Moon, B. I., Yoon, H., Yun, I. & Kang, S., 2004, In : Lecture Notes in Computer Science. 3320, p. 539-544 6 p.

Research output: Contribution to journalConference article

3 Citations (Scopus)

RAIN (RAndom INsertion) scheduling algorithm for SoC test

Im, J. B., Chun, S., Kim, G., An, J. H. & Kang, S., 2004, In : Proceedings of the Asian Test Symposium. p. 242-247 6 p.

Research output: Contribution to journalConference article

8 Citations (Scopus)
2003

A New Maximal Diagnosis Algorithm for Bus-structured Systems

Kim, Y. J., Song, D. S., Shin, Y. S., Chun, S. & Kang, S., 2003, In : IEEE International Test Conference (TC). p. 349-357 9 p.

Research output: Contribution to journalConference article

2001

An efficient ABR service engine for ATM network

Choi, Y., Kang, S. & Chong, S., 2001, In : Proceedings of the Annual IEEE International ASIC Conference and Exhibit. p. 261-265 5 p.

Research output: Contribution to journalConference article

A new multiple weight set calculation algorithm

Kim, H. S., Lee, J. K. & Kang, S., 2001, In : IEEE International Test Conference (TC). p. 878-884 7 p.

Research output: Contribution to journalConference article

10 Citations (Scopus)
1999

At-speed boundary-scan interconnect testing in a board with multiple system clocks

Shin, J., Kim, H. & Kang, S., 1999, In : Proceedings -Design, Automation and Test in Europe, DATE. p. 473-477 5 p., 761168.

Research output: Contribution to journalConference article

8 Citations (Scopus)
1997

Efficient redundancy identification for test pattern generation

Han, S. & Kang, S., 1997, In : Proceedings of the Annual IEEE International ASIC Conference and Exhibit. p. 52-56 5 p.

Research output: Contribution to journalConference article

Parallel test algorithm for pattern sensitive faults in semiconductor random access memories

Lee, J. C., Kang, Y. S. & Kang, S., 1997, In : Proceedings - IEEE International Symposium on Circuits and Systems. 4, p. 2721-2724 4 p.

Research output: Contribution to journalConference article

5 Citations (Scopus)
1996

Efficient path-delay fault simulator for mixed level circuits

Kang, Y. S., Yim, Y. T. & Kang, S., 1996, In : Proceedings of the Annual IEEE International ASIC Conference and Exhibit. p. 263-266 4 p.

Research output: Contribution to journalConference article

Efficient simulation model generation using automatic programming techniques

Lee, J. W. & Kang, S., 1996, In : Winter Simulation Conference Proceedings. p. 708-713 6 p.

Research output: Contribution to journalConference article

2 Citations (Scopus)
1995

Single chip array processor for high performance design error simulation

Kang, S. & Szygenda, S. A., 1995, In : Proceedings of the Annual IEEE International ASIC Conference and Exhibit. p. 338-341 4 p.

Research output: Contribution to journalConference article