2-Level LFSR scheme with asynchronous test pattern transfer for low cost and high efficiency built-in-self-test

S. M. Yoo, S. O. Jung, S. M. Kang

Research output: Contribution to journalConference articlepeer-review

1 Citation (Scopus)

Fingerprint

Dive into the research topics of '2-Level LFSR scheme with asynchronous test pattern transfer for low cost and high efficiency built-in-self-test'. Together they form a unique fingerprint.

Engineering & Materials Science