2D MoS2 Charge Injection Memory Transistors Utilizing Hetero-Stack SiO2/HfO2 Dielectrics and Oxide Interface Traps

Livia Janice Widiapradja, Taewook Nam, Yeonsu Jeong, Hye Jin Jin, Yangjin Lee, Kwanpyo Kim, Sangyoon Lee, Hyungjun Kim, Heesun Bae, Seongil Im

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