3D motion artifact compenstation in CT image with depth camera

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Computed tomography (CT) is a medical imaging technology that projects computer-processed X-rays to acquire tomographic images or the slices of specific organ of body. A motion artifact caused by patient motion is a common problem in CT system and may introduce undesirable artifacts in CT images. This paper analyzes the critical problems in motion artifacts and proposes a new CT system for motion artifact compensation. We employ depth cameras to capture the patient motion and account it for the CT image reconstruction. In this way, we achieve the significant improvement in motion artifact compensation, which is not possible by previous techniques.

Original languageEnglish
Title of host publicationProceedings of SPIE-IS and T Electronic Imaging - Image Processing
Subtitle of host publicationMachine Vision Applications VIII
EditorsKurt S. Niel, Edmund Y. Lam
PublisherSPIE
ISBN (Electronic)9781628414950
DOIs
Publication statusPublished - 2015 Jan 1
EventImage Processing: Machine Vision Applications VIII - San Francisco, United States
Duration: 2015 Feb 102015 Feb 11

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9405
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherImage Processing: Machine Vision Applications VIII
CountryUnited States
CitySan Francisco
Period15/2/1015/2/11

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • Cite this

    Ko, Y., Baek, J., & Shim, H. (2015). 3D motion artifact compenstation in CT image with depth camera. In K. S. Niel, & E. Y. Lam (Eds.), Proceedings of SPIE-IS and T Electronic Imaging - Image Processing: Machine Vision Applications VIII [94050R] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9405). SPIE. https://doi.org/10.1117/12.2083166