5.4 A 76mW 500fps VGA CMOS Image Sensor with Time-Stretched Single-Slope ADCs Achieving 1.95e- Random Noise

Injun Park; Chanmin Park; Jimin Cheon; Youngcheol Chae

doi:10.1109/ISSCC.2019.8662388

5.4 A 76mW 500fps VGA CMOS Image Sensor with Time-Stretched Single-Slope ADCs Achieving 1.95e^- Random Noise

Injun Park, Chanmin Park, Jimin Cheon, Youngcheol Chae

Department of Electrical and Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

3 Citations (Scopus)

Abstract

The demand for high-frame-rate CMOS image sensors is steadily increasing. Column-parallel single-slope (SS) ADCs are widely used in CMOS image sensors, because they can be implemented with small area, low noise, and high energy efficiency. To achieve high frame rate and low noise simultaneously, several techniques using SS ADCs, such as parallel multiple sampling [1], [2], dual-gain slopes [3], and dual-gain amplifiers [4], have been investigated. However, since the clock frequency of the SS ADC is already in the GHz range, it is very challenging to maintain energy efficiency as the frame rate increases further.

Original language	English
Title of host publication	2019 IEEE International Solid-State Circuits Conference, ISSCC 2019
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	100-103
Number of pages	4
ISBN (Electronic)	9781538685310
DOIs	https://doi.org/10.1109/ISSCC.2019.8662388
Publication status	Published - 2019 Mar 6
Event	2019 IEEE International Solid-State Circuits Conference, ISSCC 2019 - San Francisco, United States Duration: 2019 Feb 17 → 2019 Feb 21

Publication series

Name	Digest of Technical Papers - IEEE International Solid-State Circuits Conference
Volume	2019-February
ISSN (Print)	0193-6530

Conference

Conference	2019 IEEE International Solid-State Circuits Conference, ISSCC 2019
Country	United States
City	San Francisco
Period	19/2/17 → 19/2/21

Bibliographical note

Funding Information:
This work was supported by Samsung Research Funding & Incubation Center of Samsung Electronics under Project Number SRFC-IT1701-08

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

Access to Document

10.1109/ISSCC.2019.8662388

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Park, I., Park, C., Cheon, J., & Chae, Y. (2019). 5.4 A 76mW 500fps VGA CMOS Image Sensor with Time-Stretched Single-Slope ADCs Achieving 1.95e^- Random Noise. In 2019 IEEE International Solid-State Circuits Conference, ISSCC 2019 (pp. 100-103). [8662388] (Digest of Technical Papers - IEEE International Solid-State Circuits Conference; Vol. 2019-February). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISSCC.2019.8662388

Park, Injun ; Park, Chanmin ; Cheon, Jimin ; Chae, Youngcheol. / 5.4 A 76mW 500fps VGA CMOS Image Sensor with Time-Stretched Single-Slope ADCs Achieving 1.95e^- Random Noise. 2019 IEEE International Solid-State Circuits Conference, ISSCC 2019. Institute of Electrical and Electronics Engineers Inc., 2019. pp. 100-103 (Digest of Technical Papers - IEEE International Solid-State Circuits Conference).

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title = "5.4 A 76mW 500fps VGA CMOS Image Sensor with Time-Stretched Single-Slope ADCs Achieving 1.95e- Random Noise",

abstract = "The demand for high-frame-rate CMOS image sensors is steadily increasing. Column-parallel single-slope (SS) ADCs are widely used in CMOS image sensors, because they can be implemented with small area, low noise, and high energy efficiency. To achieve high frame rate and low noise simultaneously, several techniques using SS ADCs, such as parallel multiple sampling [1], [2], dual-gain slopes [3], and dual-gain amplifiers [4], have been investigated. However, since the clock frequency of the SS ADC is already in the GHz range, it is very challenging to maintain energy efficiency as the frame rate increases further.",

author = "Injun Park and Chanmin Park and Jimin Cheon and Youngcheol Chae",

note = "Funding Information: This work was supported by Samsung Research Funding & Incubation Center of Samsung Electronics under Project Number SRFC-IT1701-08; 2019 IEEE International Solid-State Circuits Conference, ISSCC 2019 ; Conference date: 17-02-2019 Through 21-02-2019",

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Park, I, Park, C, Cheon, J & Chae, Y 2019, 5.4 A 76mW 500fps VGA CMOS Image Sensor with Time-Stretched Single-Slope ADCs Achieving 1.95e^- Random Noise. in 2019 IEEE International Solid-State Circuits Conference, ISSCC 2019., 8662388, Digest of Technical Papers - IEEE International Solid-State Circuits Conference, vol. 2019-February, Institute of Electrical and Electronics Engineers Inc., pp. 100-103, 2019 IEEE International Solid-State Circuits Conference, ISSCC 2019, San Francisco, United States, 19/2/17. https://doi.org/10.1109/ISSCC.2019.8662388

5.4 A 76mW 500fps VGA CMOS Image Sensor with Time-Stretched Single-Slope ADCs Achieving 1.95e^- Random Noise. / Park, Injun; Park, Chanmin; Cheon, Jimin; Chae, Youngcheol.

2019 IEEE International Solid-State Circuits Conference, ISSCC 2019. Institute of Electrical and Electronics Engineers Inc., 2019. p. 100-103 8662388 (Digest of Technical Papers - IEEE International Solid-State Circuits Conference; Vol. 2019-February).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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Park I, Park C, Cheon J, Chae Y. 5.4 A 76mW 500fps VGA CMOS Image Sensor with Time-Stretched Single-Slope ADCs Achieving 1.95e^- Random Noise. In 2019 IEEE International Solid-State Circuits Conference, ISSCC 2019. Institute of Electrical and Electronics Engineers Inc. 2019. p. 100-103. 8662388. (Digest of Technical Papers - IEEE International Solid-State Circuits Conference). https://doi.org/10.1109/ISSCC.2019.8662388