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• Reliability-based multiview depth enhancement considering interview coherence

  Choi, J., Min, D. & Sohn, K., 2014 Apr, In: IEEE Transactions on Circuits and Systems for Video Technology. 24, 4, p. 603-616 14 p., 6578545.

  Research output: Contribution to journal › Article › peer-review
  23 Citations (Scopus)

• Reliability-based optimisation design of post-tensioned concrete box girder bridges considering pitting corrosion attack

  Nguyen, V. S., Jeong, M. C., Han, T. S. & Kong, J. S., 2013 Jan, In: Structure and Infrastructure Engineering. 9, 1, p. 78-96 19 p.

  Research output: Contribution to journal › Article › peer-review
  11 Citations (Scopus)

• Reliability-based robust design optimization of gap size of annular nuclear fuels using kriging and inverse distance weighting methods

  Doh, J., Kim, Y. & Lee, J., 2018 Dec 2, In: Engineering Optimization. 50, 12, p. 2161-2176 16 p.

  Research output: Contribution to journal › Article › peer-review
  8 Citations (Scopus)

• Reliability check via weight similarity in privacy-preserving multi-party machine learning

  Edemacu, K., Jang, B. & Kim, J. W., 2021 Oct, In: Information sciences. 574, p. 51-65 15 p.

  Research output: Contribution to journal › Article › peer-review
  3 Citations (Scopus)

• Reliability comparison of various regenerating codes for cloud services

  Kim, J. H., Park, J. S., Park, K. H., Kim, I., Nam, M. Y. & Song, H. Y., 2013, 2013 International Conference on ICT Convergence: "Future Creative Convergence Technologies for New ICT Ecosystems", ICTC 2013. IEEE Computer Society, p. 649-653 5 p. 6675444. (International Conference on ICT Convergence).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
  1 Citation (Scopus)

• Reliability considerations of laser diodes for optical communication system application

  Hwang, N., Song, M. K., Kang, S. G., Lee, H. T., Park, K. H., Jang, D. H., Park, S. S., Han, H. S., Kim, D. G. & Park, H. M., 1995, In: Proceedings - Electronic Components and Technology Conference. p. 318-322 5 p.

  Research output: Contribution to journal › Conference article › peer-review
  3 Citations (Scopus)

• Reliability Enhanced Heterogeneous Phase Change Memory Architecture for Performance and Energy Efficiency

  Kwon, T., Imran, M. & Yang, J. S., 2021 Sept 1, In: IEEE Transactions on Computers. 70, 9, p. 1388-1400 13 p., 9141408.

  Research output: Contribution to journal › Article › peer-review
  9 Citations (Scopus)

• Reliability evaluation of a PSC highway bridge based on resistance capacity degradation due to a corrosive environment

  Kim, S. H., Choi, J. G., Ham, S. M. & Heo, W. H., 2016, In: Applied Sciences (Switzerland). 6, 12, 423.

  Research output: Contribution to journal › Article › peer-review

  Open Access
  11 Citations (Scopus)

• Reliability improvement using receive mode selection in the device-to-device uplink period underlaying cellular networks

  Min, H., Seo, W., Lee, J., Park, S. & Hong, D., 2011 Feb, In: IEEE Transactions on Wireless Communications. 10, 2, p. 413-418 6 p., 5675650.

  Research output: Contribution to journal › Article › peer-review
  300 Citations (Scopus)

• Reliability modeling and analysis of flicker noise for pore structure in amorphous chalcogenide-based phase-change memory devices

  Lim, J. Y. & Yun, I., 2015 Aug, In: Microelectronics Reliability. 55, 9-10, p. 1320-1322 3 p.

  Research output: Contribution to journal › Article › peer-review
  2 Citations (Scopus)

• Reliability of Acoustic Measures in Dysphonic Patients With Glottic Insufficiency and Healthy Population: A COVID-19 Perspective

  Lee, S. J., Kang, M. S., Park, Y. M. & Lim, J. Y., 2022, (Accepted/In press) In: Journal of Voice.

  Research output: Contribution to journal › Article › peer-review

  Open Access
  1 Citation (Scopus)

• Reliability of Anterior Nasal Spine as a Reference Point after LeFort i Surgery Using Three-Dimensional Analysis

  Jung, S., Kim, J. Y., Jung, Y. S. & Jung, H. D., 2022 Oct 1, In: Journal of Craniofacial Surgery. 33, 7, p. 2104-2108 5 p.

  Research output: Contribution to journal › Article › peer-review
  1 Citation (Scopus)

• Reliability of assessing postural control during seated balancing using a physical human-robot interaction

  Ramadan, A., Cholewicki, J., Radcliffe, C. J., Popovich, J. M., Reeves, N. P. & Choi, J., 2017 Nov 7, In: Journal of Biomechanics. 64, p. 198-205 8 p.

  Research output: Contribution to journal › Article › peer-review
  7 Citations (Scopus)

• Reliability of assessing trunk motor control using position and force tracking and stabilization tasks

  Reeves, N. P., Popovich, J. M., Priess, M. C., Cholewicki, J., Choi, J. & Radcliffe, C. J., 2014 Jan 3, In: Journal of Biomechanics. 47, 1, p. 44-49 6 p.

  Research output: Contribution to journal › Article › peer-review
  14 Citations (Scopus)

• Reliability of breast ultrasound BI-RADS final assessment in mammographically negative patients with nipple discharge and radiologic predictors of malignancy

  Park, C. J., Kim, E. K., Moon, H. J., Yoon, J. H. & Kim, M. J., 2016 Sept, In: Journal of Breast Cancer. 19, 3, p. 308-315 8 p.

  Research output: Contribution to journal › Article › peer-review

  Open Access
  11 Citations (Scopus)

• Reliability of Crystalline Indium-Gallium-Zinc-Oxide Thin-Film Transistors under Bias Stress with Light Illumination

  Park, K., Park, H. W., Shin, H. S., Bae, J., Park, K. S., Kang, I., Chung, K. B. & Kwon, J. Y., 2015 Sept 1, In: IEEE Transactions on Electron Devices. 62, 9, p. 2900-2905 6 p., 7180350.

  Research output: Contribution to journal › Article › peer-review
  27 Citations (Scopus)

• Reliability of Galvanostatic Pulse Technique in assessing the corrosion rate of rebar in concrete structures: Laboratory vs field studies

  Vedalakshmi, R., Balamurugan, L., Saraswathy, V., Kim, S. H. & Ann, K. Y., 2010 Nov, In: KSCE Journal of Civil Engineering. 14, 6, p. 867-877 11 p.

  Research output: Contribution to journal › Article › peer-review
  21 Citations (Scopus)

• Reliability of high-power LED packaging and assembly

  Liu, C. Y., Ricky Lee, S. W., Shin, M. W. & Lai, Y. S., 2012 May, In: Microelectronics Reliability. 52, 5, p. 761 1 p.

  Research output: Contribution to journal › Editorial › peer-review
  1 Citation (Scopus)

• Reliability of InGaAs waveguide photodiodes for 40-Gb/s optical receivers

  Joo, H. S., Jeon, S. C., Lee, B., Yoon, H., Kwon, Y. H., Choe, J. S. & Yun, I., 2005 Jun, In: IEEE Transactions on Device and Materials Reliability. 5, 2, p. 262-267 6 p.

  Research output: Contribution to journal › Article › peer-review
  6 Citations (Scopus)

• Reliability of Manually Segmenting T1ρ Magnetic Resonance Sequences of Talar Articular Cartilage

  Song, K., Kosik, K. B., Gribble, P. A. & Wikstrom, E. A., 2022 Jan, In: Journal of Sport Rehabilitation. 31, 1, p. 111-114 4 p.

  Research output: Contribution to journal › Article › peer-review

• Reliability of microarray analysis for studying periodontitis: low consistency in 2 periodontitis cohort data sets from different platforms and an integrative meta-analysis

  Jeon, Y. S., Shivakumar, M., Kim, D., Kim, C. S. & Lee, J. S., 2021 Feb, In: Journal of Periodontal and Implant Science. 51, 1, p. 18-29 12 p.

  Research output: Contribution to journal › Article › peer-review
  1 Citation (Scopus)

• Reliability of MIM HAO capacitor for 70NM DRAM

  Hong, K., Kil, D. S., Woo, H. K., Kim, J., Song, H. S., Park, K. S., Yeom, S. J., Yang, H. S., Roh, J. S., Sohn, H. C., Kim, J. W. & Park, S. W., 2005, 2005 IEEE International Reliability Physics Symposium Proceedings, 43rd Annual. p. 686-687 2 p. (IEEE International Reliability Physics Symposium Proceedings).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
  1 Citation (Scopus)

• Reliability of oxide thin film transistors under the gate bias stress with 400 nm wavelength light illumination

  Lee, S. Y., Kim, S. J., Lee, Y., Lee, W. G., Yoon, K. S., Kwon, J. Y. & Han, M. K., 2012, Amorphous and Polycrystalline Thin-Film Silicon Science and Technology - 2011. p. 253-257 5 p. (Materials Research Society Symposium Proceedings; vol. 1321).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

• Reliability of planar InP-InGaAs avalanche photodiodes with recess etching

  Jung, J., Kwon, Y. H., Hyun, K. S. & Yun, I., 2002 Aug, In: IEEE Photonics Technology Letters. 14, 8, p. 1160-1162 3 p.

  Research output: Contribution to journal › Article › peer-review
  15 Citations (Scopus)

• Reliability of representative reviewers on the Web

  Choi, S. M., Cha, J. W., Kim, L. & Han, Y. S., 2011, 2011 International Conference on Information Science and Applications, ICISA 2011. 5772422. (2011 International Conference on Information Science and Applications, ICISA 2011).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
  1 Citation (Scopus)

• Reliability of RTVue, visante, and slit-lamp adapted ultrasonic pachymetry for central corneal thickness measurement

  Hong, J. P., Nam, S. M., Kim, T. I., Seo, K. Y., Lee, S. Y., Meduri, A. & Kim, E. K., 2012 May, In: Yonsei medical journal. 53, 3, p. 634-641 8 p.

  Research output: Contribution to journal › Article › peer-review

  Open Access
  16 Citations (Scopus)

• Reliability of self-reported information by farmers on pesticide use

  Lee, Y. H., Cha, E. S., Moon, E. K., Kong, K. A., Koh, S. B., Lee, Y. K. & Lee, W. J., 2010 Nov, In: Journal of Preventive Medicine and Public Health. 43, 6, p. 535-542 8 p.

  Research output: Contribution to journal › Article › peer-review

  Open Access
  6 Citations (Scopus)

• Reliability of the ICD‐10 diagnostic criteria for research in mental disorders in the Republic of Korea

  Rhi, B. Y., Kwon, J. S., Lee, C., Paik, I. H., Cho, M. J., Lee, Z. N., Lee, J. H., Hahn, K. H., Kim, J. J., Han, S. H., Suk, J. H. & Woo, J. I., 1995 May, In: Acta Psychiatrica Scandinavica. 91, 5, p. 341-347 7 p.

  Research output: Contribution to journal › Article › peer-review
  1 Citation (Scopus)

• Reliability of two different presurgical preparation methods for implant dentistry based on panoramic radiography and cone-beam computed tomography in cadavers

  Hu, K. S., Choi, D. Y., Lee, W. J., Kim, H. J., Jung, U. W. & Kim, S., 2012 Apr, In: Journal of Periodontal and Implant Science. 42, 2, p. 39-44 6 p.

  Research output: Contribution to journal › Article › peer-review
  22 Citations (Scopus)

• Reliability-performance tradeoffs between 2.5D and 3D-stacked DRAM processors

  Hassan, S. M., Song, W. J., Mukhopadhyay, S. & Yalamanchili, S., 2016 Sept 22, 2016 International Reliability Physics Symposium, IRPS 2016. Institute of Electrical and Electronics Engineers Inc., p. MY21-MY25 7574618. (IEEE International Reliability Physics Symposium Proceedings; vol. 2016-September).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
  5 Citations (Scopus)

• Reliability schemes for P2P systems in dynamic mobile environments

  Kim, J. H., Song, J. W., Kim, T. H., Lee, J. H., Lee, K. J., Han, J. S. & Yang, S. B., 2008, Proceedings - International Symposium on Computer Science and Its Applications, CSA 2008. p. 338-342 5 p. 4654111. (Proceedings - International Symposium on Computer Science and Its Applications, CSA 2008).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
  3 Citations (Scopus)

• Reliability study of methods to suppress boron transient enhanced diffusion in high-k/metal gate Si/SiGe channel pMOSFETs

  Park, M. S., Kim, Y., Lee, K. T., Kang, C. Y., Min, B. G., Oh, J., Majhi, P., Tseng, H. H., Lee, J. C., Banerjee, S. K., Lee, J. S., Jammy, R. & Jeong, Y. H., 2013, In: Microelectronic Engineering. 112, p. 80-83 4 p.

  Research output: Contribution to journal › Article › peer-review
  1 Citation (Scopus)

• Reliability testing of InGaAs mesa stucture waveguide photodiodes for 40-Gb/s optical receiver applications

  Joo, H. S., Jeon, S. C., Lee, B., Kwon, Y. H., Choe, J. S. & Yun, I., 2004, IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai. Nozawa, H. (ed.). Institute of Electrical and Electronics Engineers Inc., p. 73-74 2 p. 1566414. (IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

• Reliability testing of single diffused planar InP/InGaAs avalanche photodiodes

  Jung, J., Kwon, Y. H., Hyun, K. S. & Yun, I., 2002, In: Proceedings of the IEEE/CPMT International Electronics Manufacturing Technology (IEMT) Symposium. p. 193-194 2 p., 34.

  Research output: Contribution to journal › Article › peer-review
  2 Citations (Scopus)

• Reliable and cost effective design of intermetallic Ni 2 Si nanowires and direct characterization of its mechanical properties

  Han, S. Z., Kang, J., Kim, S. D., Choi, S. Y., Kim, H. G., Lee, J., Kim, K., Lim, S. H. & Han, B., 2015 Oct 12, In: Scientific reports. 5, 15050.

  Research output: Contribution to journal › Article › peer-review

  Open Access
  19 Citations (Scopus)

• Reliable and energy-efficient downward packet delivery in asymmetric transmission power-based networks

  Kim, H. S., Lee, M. S., Choi, Y. J., Ko, J. & Bahk, S., 2016 Sept, In: ACM Transactions on Sensor Networks. 12, 4, 34.

  Research output: Contribution to journal › Article › peer-review
  9 Citations (Scopus)

• Reliable and Lightweight PUF-based Key Generation using Various Index Voting Architecture

  Kim, J. H., Jo, H. J., Jo, K. K., Cho, S. H., Chung, J. Y. & Yang, J. S., 2020 Mar, Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020. Di Natale, G., Bolchini, C. & Vatajelu, E-I. (eds.). Institute of Electrical and Electronics Engineers Inc., p. 352-357 6 p. 9116519. (Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
  2 Citations (Scopus)

• Reliable and uniform thin-film transistor arrays based on inkjet-printed polymer semiconductors for full color reflective displays

  Lee, J., Kim, D. H., Kim, J. Y., Yoo, B., Chung, J. W., Park, J. I., Lee, B. L., Jung, J. Y., Park, J. S., Koo, B., Im, S., Kim, J. W., Song, B., Jung, M. H., Jang, J. E., Jin, Y. W. & Lee, S. Y., 2013 Nov 6, In: Advanced Materials. 25, 41, p. 5886-5892 7 p.

  Research output: Contribution to journal › Article › peer-review
  57 Citations (Scopus)

• Reliable bottom gate amorphous indium-gallium-zinc oxide thin-film transistors with TiO_x passivation layer

  Seo, H. S., Bae, J. U., Kim, D. H., Park, Y. J., Kim, C. D., Kang, I. B., Chung, I. J., Choi, J. H. & Myoung, J. M., 2009, In: Electrochemical and Solid-State Letters. 12, 9, p. H348-H351

  Research output: Contribution to journal › Article › peer-review
  50 Citations (Scopus)

• Reliable cluster computing with a new checkpointing RAID-x architecture

  Hwang, K., Jin, H., Ho, R. & Ro, W., 2000, In: Proceedings of the Heterogeneous Computing Workshop, HCW. p. 171-184 14 p.

  Research output: Contribution to journal › Article › peer-review
  11 Citations (Scopus)

• Reliable estimation of hydraulic permeability from 3D X-ray CT images of porous rock

  Yang, E., Kang, D. H. & Yun, T. S., 2020 Nov 18, In: E3S Web of Conferences. 205, 08004.

  Research output: Contribution to journal › Conference article › peer-review

  Open Access
  1 Citation (Scopus)

• Reliable fidelity and diversity metrics for generative models

  Naeem, M. F., Oh, S. J., Uh, Y., Choi, Y. & Yoo, J., 2020, 37th International Conference on Machine Learning, ICML 2020. Daume, H. & Singh, A. (eds.). International Machine Learning Society (IMLS), p. 7133-7142 10 p. (37th International Conference on Machine Learning, ICML 2020; vol. PartF168147-10).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
  24 Citations (Scopus)

• Reliable Knowledge Graph Path Representation Learning

  Seo, S., Oh, B. & Lee, K. H., 2020, In: IEEE Access. 8, p. 32816-32825 10 p., 8999619.

  Research output: Contribution to journal › Article › peer-review

  Open Access
  5 Citations (Scopus)

• Reliable Latency Extraction with NVSim Revision in Emerging NVM (ITC-CSCC 2019)

  Seo, W., Song, B. & Jung, S. O., 2019 Jun, 34th International Technical Conference on Circuits/Systems, Computers and Communications, ITC-CSCC 2019. Institute of Electrical and Electronics Engineers Inc., 8793402. (34th International Technical Conference on Circuits/Systems, Computers and Communications, ITC-CSCC 2019).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

• Reliable operation of a nanogenerator under ultraviolet light via engineering piezoelectric potential

  Pham, T. T., Lee, K. Y., Lee, J. H., Kim, K. H., Shin, K. S., Gupta, M. K., Kumar, B. & Kim, S. W., 2013 Mar, In: Energy and Environmental Science. 6, 3, p. 841-846 6 p.

  Research output: Contribution to journal › Article › peer-review

• Reliable optical measurement of water vapor in highly scattering environment

  Park, H., Lee, K., Kang, G., Song, S., Jung, Y., Kim, K., Bae, J., Lee, J. & Park, H., 2009 Apr, In: Spectrochimica Acta - Part A: Molecular and Biomolecular Spectroscopy. 72, 3, p. 510-514 5 p.

  Research output: Contribution to journal › Article › peer-review
  4 Citations (Scopus)

• Reliable Perceptual Loss Computation for GAN-Based Super-Resolution with Edge Texture Metric

  Kim, J. & Lee, C., 2021, In: IEEE Access. 9, p. 120127-120137 11 p., 9524635.

  Research output: Contribution to journal › Article › peer-review

  Open Access

• Reliable Piezoelectricity in Bilayer WSe₂ for Piezoelectric Nanogenerators

  Lee, J. H., Park, J. Y., Cho, E. B., Kim, T. Y., Han, S. A., Kim, T. H., Liu, Y., Kim, S. K., Roh, C. J., Yoon, H. J., Ryu, H., Seung, W., Lee, J. S., Lee, J. & Kim, S. W., 2017 Aug 4, In: Advanced Materials. 29, 29, 1606667.

  Research output: Contribution to journal › Article › peer-review

• Reliable position based routing algorithm in Vehicular Ad-hoc Network

  Park, K., Kim, H. & Lee, S., 2015 Aug 7, ICUFN 2015 - 7th International Conference on Ubiquitous and Future Networks. IEEE Computer Society, p. 344-349 6 p. 7182562. (International Conference on Ubiquitous and Future Networks, ICUFN; vol. 2015-August).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
  3 Citations (Scopus)

• Reliable routing protocol for Vehicular Ad Hoc Networks

  Kim, J. H. & Lee, S., 2011 Mar, In: AEU - International Journal of Electronics and Communications. 65, 3, p. 268-271 4 p.

  Research output: Contribution to journal › Article › peer-review
  31 Citations (Scopus)