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  • 2019
  • 2018
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  • 2016

Author

  • Chang Ouk Kim
2019

Adaptive Weapon-to-Target Assignment Model Based on the Real-Time Prediction of Hit Probability

Jang, J., Yoon, H. G., Kim, J. C. & Kim, C. O., 2019, In : IEEE Access. 7, p. 72210-72220 11 p., 8725473.

Research output: Contribution to journalArticle

Open Access
2 Citations (Scopus)

Agent simulation-based ordinal optimisation for new product design

Lee, H., Lim, J., Lee, K. & Kim, C. O., 2019 Mar 4, In : Journal of the Operational Research Society. 70, 3, p. 502-515 14 p.

Research output: Contribution to journalArticle

1 Citation (Scopus)

Automatic inspection of salt-and-pepper defects in OLED panels using image processing and control chart techniques

Kwak, J., Lee, K. B., Jang, J., Chang, K. S. & Kim, C. O., 2019 Mar 15, In : Journal of Intelligent Manufacturing. 30, 3, p. 1047-1055 9 p.

Research output: Contribution to journalArticle

Convolutional Neural Network for Wafer Surface Defect Classification and the Detection of Unknown Defect Class

Cheon, S., Lee, H., Kim, C. O. & Lee, S. H., 2019 May, In : IEEE Transactions on Semiconductor Manufacturing. 32, 2, p. 163-170 8 p., 8657760.

Research output: Contribution to journalArticle

23 Citations (Scopus)

Denoised Residual Trace Analysis for Monitoring Semiconductor Process Faults

Jang, J., Min, B. W. & Kim, C. O., 2019 Aug, In : IEEE Transactions on Semiconductor Manufacturing. 32, 3, p. 293-301 9 p., 8713521.

Research output: Contribution to journalArticle

1 Citation (Scopus)

Marker layout for optimizing the overlay alignment in a photolithography process

Lee, K. B. & Kim, C. O., 2019 May, In : IEEE Transactions on Semiconductor Manufacturing. 32, 2, p. 212-219 8 p., 8675528.

Research output: Contribution to journalArticle

1 Citation (Scopus)
2017

A convolutional neural network for fault classification and diagnosis in semiconductor manufacturing processes

Lee, K. B., Cheon, S. & Kim, C. O., 2017 May, In : IEEE Transactions on Semiconductor Manufacturing. 30, 2, p. 135-142 8 p.

Research output: Contribution to journalArticle

115 Citations (Scopus)

A deep learning model for robust wafer fault monitoring with sensor measurement noise

Lee, H., Kim, Y. & Kim, C. O., 2017 Feb, In : IEEE Transactions on Semiconductor Manufacturing. 30, 1, p. 23-31 9 p., 7744687.

Research output: Contribution to journalArticle

38 Citations (Scopus)

Threat evaluation of enemy air fighters via neural network-based Markov chain modeling

Lee, H., Choi, B. J., Kim, C. O., Kim, J. S. & Kim, J. E., 2017 Jan 15, In : Knowledge-Based Systems. 116, p. 49-57 9 p.

Research output: Contribution to journalArticle

15 Citations (Scopus)
2016

Opinion polarity detection in Twitter data combining shrinkage regression and topic modeling

Yoon, H. G., Kim, H., Kim, C. O. & Song, M., 2016 May 1, In : Journal of Informetrics. 10, 2, p. 634-644 11 p.

Research output: Contribution to journalArticle

22 Citations (Scopus)

Performance of Machine Learning Algorithms for Class-Imbalanced Process Fault Detection Problems

Lee, T., Lee, K. B. & Kim, C. O., 2016 Nov, In : IEEE Transactions on Semiconductor Manufacturing. 29, 4, p. 436-445 10 p., 7549079.

Research output: Contribution to journalArticle

13 Citations (Scopus)