TY - GEN
T1 - A 0.85V 600nW all-CMOS temperature sensor with an inaccuracy of ±0.4°C (3s) from -40 to 125°C
AU - Souri, Kamran
AU - Chae, Youngcheol
AU - Thus, Frank
AU - Makinwa, Kofi
PY - 2014
Y1 - 2014
N2 - This paper describes an all-CMOS temperature sensor intended for RFID applications that achieves both sub-1V operation and high accuracy (±0.4°C) over a wide temperature range (-40 to 125°C). It is also an ultra-low-power design: drawing 700nA from a 0.85V supply. This is achieved by the use of dynamic threshold MOSTs (DTMOSTs) as temperature-sensing devices, which are then read out by an inverter-based 2nd-order zoom ADC. Circuit errors are mitigated by the use of dynamic error-correction techniques, while DTMOST spread is reduced by a single room temperature (RT) trim. The latter feature constitutes a significant advance over previous all-CMOS designs [5,6], which require two-point trimming to approach the same level of accuracy.
AB - This paper describes an all-CMOS temperature sensor intended for RFID applications that achieves both sub-1V operation and high accuracy (±0.4°C) over a wide temperature range (-40 to 125°C). It is also an ultra-low-power design: drawing 700nA from a 0.85V supply. This is achieved by the use of dynamic threshold MOSTs (DTMOSTs) as temperature-sensing devices, which are then read out by an inverter-based 2nd-order zoom ADC. Circuit errors are mitigated by the use of dynamic error-correction techniques, while DTMOST spread is reduced by a single room temperature (RT) trim. The latter feature constitutes a significant advance over previous all-CMOS designs [5,6], which require two-point trimming to approach the same level of accuracy.
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U2 - 10.1109/ISSCC.2014.6757409
DO - 10.1109/ISSCC.2014.6757409
M3 - Conference contribution
AN - SCOPUS:84898060677
SN - 9781479909186
T3 - Digest of Technical Papers - IEEE International Solid-State Circuits Conference
SP - 222
EP - 223
BT - 2014 IEEE International Solid-State Circuits Conference, ISSCC 2014 - Digest of Technical Papers
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2014 61st IEEE International Solid-State Circuits Conference, ISSCC 2014
Y2 - 9 February 2014 through 13 February 2014
ER -