Abstract
This letter presents a two-stage dynamic amplifier that achieves the high dc gain and PVT robustness of the residue amplifier in a pipelined successive approximation register (SAR) analog-to-digital converter (ADC). The proposed dynamic amplifier operates in a closed-loop configuration and does not require further calibration. The pipelined SAR ADC occupies 0.065 mm2 in a 65-nm CMOS process. It achieves a peak signal-to-noise-and-distortion ratio (SNDR) of 68.8 dB at a sampling rate of 20 MS/s and draws 348 μ W from a 1.2-V supply. This corresponds to a Schreier FoM of 173.4 dB and a Walden FoM of 7.7 fJ/conv.-step. Furthermore, it maintains SNDRs over various sampling rates from 1 to 20 MS/s and its power consumption is scaled linearly.
Original language | English |
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Pages (from-to) | 166-169 |
Number of pages | 4 |
Journal | IEEE Solid-State Circuits Letters |
Volume | 4 |
DOIs | |
Publication status | Published - 2021 |
Bibliographical note
Publisher Copyright:© 2018 IEEE.
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering