A 5.2Mpixel 88.4dB-DR 12in CMOS X-Ray Detector with 16b Column-Parallel Continuous-Time ΔΣ ADCs

Sangwoo Lee; Jinwoong Jeong; Taewoong Kim; Chanmin Park; Taewoo Kim; Youngcheol Chae

doi:10.1109/ISSCC19947.2020.9062919

A 5.2Mpixel 88.4dB-DR 12in CMOS X-Ray Detector with 16b Column-Parallel Continuous-Time ΔΣ ADCs

Sangwoo Lee, Jinwoong Jeong, Taewoong Kim, Chanmin Park, Taewoo Kim, Youngcheol Chae

Department of Electrical and Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

4 Citations (Scopus)

Abstract

CMOS X-ray detectors used in industrial and medical equipment should provide a full image depth even for a specific region of interest, and require high resolution, low noise, and wide DR in a wafer-scale detector [1], [4]. To achieve a wide DR, a large integration capacitor is required within the pixel to prevent its saturation at high dose, but this degrades image quality at low dose. To facilitate wide DR (>70dB), a conventional detector uses a column-parallel readout with a programmable gain amplifier (PGA) and an ADC [3]. However, the PGA consumes substantially more power and area than the ADC, and its gain control requires multiple X-ray exposures. The use of switched-capacitor (SC) ΔΣ ADC provides wide DR with an improved noise performance [2], [5]. However, its SC input draws high peak current that must be supplied by pixels and reference drivers, and its complex clock distribution also requires high power consumption.

Original language	English
Title of host publication	2020 IEEE International Solid-State Circuits Conference, ISSCC 2020
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	434-436
Number of pages	3
ISBN (Electronic)	9781728132044
DOIs	https://doi.org/10.1109/ISSCC19947.2020.9062919
Publication status	Published - 2020 Feb
Event	2020 IEEE International Solid-State Circuits Conference, ISSCC 2020 - San Francisco, United States Duration: 2020 Feb 16 → 2020 Feb 20

Publication series

Name	Digest of Technical Papers - IEEE International Solid-State Circuits Conference
Volume	2020-February
ISSN (Print)	0193-6530

Conference

Conference	2020 IEEE International Solid-State Circuits Conference, ISSCC 2020
Country/Territory	United States
City	San Francisco
Period	20/2/16 → 20/2/20

Bibliographical note

Publisher Copyright:
© 2020 IEEE.

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

Access to Document

10.1109/ISSCC19947.2020.9062919

Cite this

Lee, S., Jeong, J., Kim, T., Park, C., Kim, T., & Chae, Y. (2020). A 5.2Mpixel 88.4dB-DR 12in CMOS X-Ray Detector with 16b Column-Parallel Continuous-Time ΔΣ ADCs. In 2020 IEEE International Solid-State Circuits Conference, ISSCC 2020 (pp. 434-436). [9062919] (Digest of Technical Papers - IEEE International Solid-State Circuits Conference; Vol. 2020-February). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISSCC19947.2020.9062919

Lee, Sangwoo ; Jeong, Jinwoong ; Kim, Taewoong et al. / A 5.2Mpixel 88.4dB-DR 12in CMOS X-Ray Detector with 16b Column-Parallel Continuous-Time ΔΣ ADCs. 2020 IEEE International Solid-State Circuits Conference, ISSCC 2020. Institute of Electrical and Electronics Engineers Inc., 2020. pp. 434-436 (Digest of Technical Papers - IEEE International Solid-State Circuits Conference).

@inproceedings{827dfa8cf130452ba4701055e32219ba,

title = "A 5.2Mpixel 88.4dB-DR 12in CMOS X-Ray Detector with 16b Column-Parallel Continuous-Time ΔΣ ADCs",

abstract = "CMOS X-ray detectors used in industrial and medical equipment should provide a full image depth even for a specific region of interest, and require high resolution, low noise, and wide DR in a wafer-scale detector [1], [4]. To achieve a wide DR, a large integration capacitor is required within the pixel to prevent its saturation at high dose, but this degrades image quality at low dose. To facilitate wide DR (>70dB), a conventional detector uses a column-parallel readout with a programmable gain amplifier (PGA) and an ADC [3]. However, the PGA consumes substantially more power and area than the ADC, and its gain control requires multiple X-ray exposures. The use of switched-capacitor (SC) ΔΣ ADC provides wide DR with an improved noise performance [2], [5]. However, its SC input draws high peak current that must be supplied by pixels and reference drivers, and its complex clock distribution also requires high power consumption.",

author = "Sangwoo Lee and Jinwoong Jeong and Taewoong Kim and Chanmin Park and Taewoo Kim and Youngcheol Chae",

note = "Publisher Copyright: {\textcopyright} 2020 IEEE.; 2020 IEEE International Solid-State Circuits Conference, ISSCC 2020 ; Conference date: 16-02-2020 Through 20-02-2020",

year = "2020",

month = feb,

doi = "10.1109/ISSCC19947.2020.9062919",

language = "English",

series = "Digest of Technical Papers - IEEE International Solid-State Circuits Conference",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "434--436",

booktitle = "2020 IEEE International Solid-State Circuits Conference, ISSCC 2020",

address = "United States",

}

Lee, S, Jeong, J, Kim, T, Park, C, Kim, T & Chae, Y 2020, A 5.2Mpixel 88.4dB-DR 12in CMOS X-Ray Detector with 16b Column-Parallel Continuous-Time ΔΣ ADCs. in 2020 IEEE International Solid-State Circuits Conference, ISSCC 2020., 9062919, Digest of Technical Papers - IEEE International Solid-State Circuits Conference, vol. 2020-February, Institute of Electrical and Electronics Engineers Inc., pp. 434-436, 2020 IEEE International Solid-State Circuits Conference, ISSCC 2020, San Francisco, United States, 20/2/16. https://doi.org/10.1109/ISSCC19947.2020.9062919

A 5.2Mpixel 88.4dB-DR 12in CMOS X-Ray Detector with 16b Column-Parallel Continuous-Time ΔΣ ADCs. / Lee, Sangwoo; Jeong, Jinwoong; Kim, Taewoong et al.

2020 IEEE International Solid-State Circuits Conference, ISSCC 2020. Institute of Electrical and Electronics Engineers Inc., 2020. p. 434-436 9062919 (Digest of Technical Papers - IEEE International Solid-State Circuits Conference; Vol. 2020-February).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - A 5.2Mpixel 88.4dB-DR 12in CMOS X-Ray Detector with 16b Column-Parallel Continuous-Time ΔΣ ADCs

AU - Lee, Sangwoo

AU - Jeong, Jinwoong

AU - Kim, Taewoong

AU - Park, Chanmin

AU - Kim, Taewoo

AU - Chae, Youngcheol

PY - 2020/2

Y1 - 2020/2

N2 - CMOS X-ray detectors used in industrial and medical equipment should provide a full image depth even for a specific region of interest, and require high resolution, low noise, and wide DR in a wafer-scale detector [1], [4]. To achieve a wide DR, a large integration capacitor is required within the pixel to prevent its saturation at high dose, but this degrades image quality at low dose. To facilitate wide DR (>70dB), a conventional detector uses a column-parallel readout with a programmable gain amplifier (PGA) and an ADC [3]. However, the PGA consumes substantially more power and area than the ADC, and its gain control requires multiple X-ray exposures. The use of switched-capacitor (SC) ΔΣ ADC provides wide DR with an improved noise performance [2], [5]. However, its SC input draws high peak current that must be supplied by pixels and reference drivers, and its complex clock distribution also requires high power consumption.

AB - CMOS X-ray detectors used in industrial and medical equipment should provide a full image depth even for a specific region of interest, and require high resolution, low noise, and wide DR in a wafer-scale detector [1], [4]. To achieve a wide DR, a large integration capacitor is required within the pixel to prevent its saturation at high dose, but this degrades image quality at low dose. To facilitate wide DR (>70dB), a conventional detector uses a column-parallel readout with a programmable gain amplifier (PGA) and an ADC [3]. However, the PGA consumes substantially more power and area than the ADC, and its gain control requires multiple X-ray exposures. The use of switched-capacitor (SC) ΔΣ ADC provides wide DR with an improved noise performance [2], [5]. However, its SC input draws high peak current that must be supplied by pixels and reference drivers, and its complex clock distribution also requires high power consumption.

UR - http://www.scopus.com/inward/record.url?scp=85083852657&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85083852657&partnerID=8YFLogxK

U2 - 10.1109/ISSCC19947.2020.9062919

DO - 10.1109/ISSCC19947.2020.9062919

M3 - Conference contribution

AN - SCOPUS:85083852657

T3 - Digest of Technical Papers - IEEE International Solid-State Circuits Conference

SP - 434

EP - 436

BT - 2020 IEEE International Solid-State Circuits Conference, ISSCC 2020

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2020 IEEE International Solid-State Circuits Conference, ISSCC 2020

Y2 - 16 February 2020 through 20 February 2020

ER -

Lee S, Jeong J, Kim T, Park C, Kim T, Chae Y. A 5.2Mpixel 88.4dB-DR 12in CMOS X-Ray Detector with 16b Column-Parallel Continuous-Time ΔΣ ADCs. In 2020 IEEE International Solid-State Circuits Conference, ISSCC 2020. Institute of Electrical and Electronics Engineers Inc. 2020. p. 434-436. 9062919. (Digest of Technical Papers - IEEE International Solid-State Circuits Conference). doi: 10.1109/ISSCC19947.2020.9062919

A 5.2Mpixel 88.4dB-DR 12in CMOS X-Ray Detector with 16b Column-Parallel Continuous-Time ΔΣ ADCs

Abstract

Publication series

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Bibliographical note

All Science Journal Classification (ASJC) codes

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