A 5.2Mpixel 88.4dB-DR 12in CMOS X-Ray Detector with 16b Column-Parallel Continuous-Time ΔΣ ADCs

Sangwoo Lee, Jinwoong Jeong, Taewoong Kim, Chanmin Park, Taewoo Kim, Youngcheol Chae

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

CMOS X-ray detectors used in industrial and medical equipment should provide a full image depth even for a specific region of interest, and require high resolution, low noise, and wide DR in a wafer-scale detector [1], [4]. To achieve a wide DR, a large integration capacitor is required within the pixel to prevent its saturation at high dose, but this degrades image quality at low dose. To facilitate wide DR (>70dB), a conventional detector uses a column-parallel readout with a programmable gain amplifier (PGA) and an ADC [3]. However, the PGA consumes substantially more power and area than the ADC, and its gain control requires multiple X-ray exposures. The use of switched-capacitor (SC) ΔΣ ADC provides wide DR with an improved noise performance [2], [5]. However, its SC input draws high peak current that must be supplied by pixels and reference drivers, and its complex clock distribution also requires high power consumption.

Original languageEnglish
Title of host publication2020 IEEE International Solid-State Circuits Conference, ISSCC 2020
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages434-436
Number of pages3
ISBN (Electronic)9781728132044
DOIs
Publication statusPublished - 2020 Feb
Event2020 IEEE International Solid-State Circuits Conference, ISSCC 2020 - San Francisco, United States
Duration: 2020 Feb 162020 Feb 20

Publication series

NameDigest of Technical Papers - IEEE International Solid-State Circuits Conference
Volume2020-February
ISSN (Print)0193-6530

Conference

Conference2020 IEEE International Solid-State Circuits Conference, ISSCC 2020
CountryUnited States
CitySan Francisco
Period20/2/1620/2/20

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'A 5.2Mpixel 88.4dB-DR 12in CMOS X-Ray Detector with 16b Column-Parallel Continuous-Time ΔΣ ADCs'. Together they form a unique fingerprint.

  • Cite this

    Lee, S., Jeong, J., Kim, T., Park, C., Kim, T., & Chae, Y. (2020). A 5.2Mpixel 88.4dB-DR 12in CMOS X-Ray Detector with 16b Column-Parallel Continuous-Time ΔΣ ADCs. In 2020 IEEE International Solid-State Circuits Conference, ISSCC 2020 (pp. 434-436). [9062919] (Digest of Technical Papers - IEEE International Solid-State Circuits Conference; Vol. 2020-February). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISSCC19947.2020.9062919