A 640×640 Fully Dynamic CMOS Image Sensor for Always-On Object Recognition

Injun Park, Woojin Jo, Chanmin Park, Byungchoul Park, Jimin Cheon, Youngcheol Chae

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

This paper presents a 640× 640 fully dynamic CMOS image sensor for always-on object recognition. A pixel output is sampled with a dynamic source follower (SF) into a parasitic column capacitor, which is readout by a dynamic single-slope (SS) ADC based on a dynamic bias comparator and an energy-efficient two-step counter. The sensor, implemented in a 0.11μm CMOS, achieves 0.3% peak non-linearity, 6.8e-rms- RN and 67dB DR. Its power consumption is only 2.1mW at 44fps and is further reduced to 260μW at 15fps with sub-sampled 320 × 320 mode. This work achieves the state-of-the-art energy-efficiency FoM of 0.7e-\cdot nJ.

Original languageEnglish
Title of host publication2019 Symposium on VLSI Circuits, VLSI Circuits 2019 - Digest of Technical Papers
PublisherInstitute of Electrical and Electronics Engineers Inc.
PagesC214-C215
ISBN (Electronic)9784863487185
DOIs
Publication statusPublished - 2019 Jun
Event33rd Symposium on VLSI Circuits, VLSI Circuits 2019 - Kyoto, Japan
Duration: 2019 Jun 92019 Jun 14

Publication series

NameIEEE Symposium on VLSI Circuits, Digest of Technical Papers
Volume2019-June

Conference

Conference33rd Symposium on VLSI Circuits, VLSI Circuits 2019
CountryJapan
CityKyoto
Period19/6/919/6/14

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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  • Cite this

    Park, I., Jo, W., Park, C., Park, B., Cheon, J., & Chae, Y. (2019). A 640×640 Fully Dynamic CMOS Image Sensor for Always-On Object Recognition. In 2019 Symposium on VLSI Circuits, VLSI Circuits 2019 - Digest of Technical Papers (pp. C214-C215). [8778169] (IEEE Symposium on VLSI Circuits, Digest of Technical Papers; Vol. 2019-June). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.23919/VLSIC.2019.8778169