TY - GEN
T1 - A 640×640 Fully Dynamic CMOS Image Sensor for Always-On Object Recognition
AU - Park, Injun
AU - Jo, Woojin
AU - Park, Chanmin
AU - Park, Byungchoul
AU - Cheon, Jimin
AU - Chae, Youngcheol
N1 - Publisher Copyright:
© 2019 JSAP.
Copyright:
Copyright 2019 Elsevier B.V., All rights reserved.
PY - 2019/6
Y1 - 2019/6
N2 - This paper presents a 640× 640 fully dynamic CMOS image sensor for always-on object recognition. A pixel output is sampled with a dynamic source follower (SF) into a parasitic column capacitor, which is readout by a dynamic single-slope (SS) ADC based on a dynamic bias comparator and an energy-efficient two-step counter. The sensor, implemented in a 0.11μm CMOS, achieves 0.3% peak non-linearity, 6.8e-rms- RN and 67dB DR. Its power consumption is only 2.1mW at 44fps and is further reduced to 260μW at 15fps with sub-sampled 320 × 320 mode. This work achieves the state-of-the-art energy-efficiency FoM of 0.7e-\cdot nJ.
AB - This paper presents a 640× 640 fully dynamic CMOS image sensor for always-on object recognition. A pixel output is sampled with a dynamic source follower (SF) into a parasitic column capacitor, which is readout by a dynamic single-slope (SS) ADC based on a dynamic bias comparator and an energy-efficient two-step counter. The sensor, implemented in a 0.11μm CMOS, achieves 0.3% peak non-linearity, 6.8e-rms- RN and 67dB DR. Its power consumption is only 2.1mW at 44fps and is further reduced to 260μW at 15fps with sub-sampled 320 × 320 mode. This work achieves the state-of-the-art energy-efficiency FoM of 0.7e-\cdot nJ.
UR - http://www.scopus.com/inward/record.url?scp=85073905557&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85073905557&partnerID=8YFLogxK
U2 - 10.23919/VLSIC.2019.8778169
DO - 10.23919/VLSIC.2019.8778169
M3 - Conference contribution
AN - SCOPUS:85073905557
T3 - IEEE Symposium on VLSI Circuits, Digest of Technical Papers
SP - C214-C215
BT - 2019 Symposium on VLSI Circuits, VLSI Circuits 2019 - Digest of Technical Papers
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 33rd Symposium on VLSI Circuits, VLSI Circuits 2019
Y2 - 9 June 2019 through 14 June 2019
ER -