A 6.9-μm23.26-ns 31.25-fj Robust Level Shifter with Wide Voltage and Frequency Ranges

Kiryong Kim, Ji Young Kim, Byoung Mo Moon, Seong Ook Jung

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

This brief presents an area- and energy-efficient level shifter (LS) with wide voltage and frequency ranges. The proposed LS removes the static current with a cut-off head PMOS. The LS also provides a robust internal node compared to other state-of-the-art LSs, where the internal node is floated. To reduce the delay and energy consumption in the proposed LS, the contention between the pull-up and pull-down networks at the internal node is reduced by using a 'low' to 'high' transition error correction circuit (LtH ECC), which also enables high frequency operation at near- and sub-threshold voltages. The proposed LS is implemented in 65 nm CMOS technology, having the smallest area of 6.90among state-of-art LSs. The measurement results demonstrate that the minimum low-level supply voltage { DDL,MIN}} ) values are 120 mV and 300 mV with input frequency of 1 MHz and 100 MHz, respectively, at a high-level supply voltage of 1.2 V. The delay and energy consumption at VDDL of 120 mV and 300 mV are 207 ns and 1040 fJ, and 3.26 ns and 31.25 fJ, respectively. The static power consumption is less than 3 nW at VDDL ranging from 120 mV to 700 mV.

Original languageEnglish
Article number9246565
Pages (from-to)1433-1437
Number of pages5
JournalIEEE Transactions on Circuits and Systems II: Express Briefs
Volume68
Issue number4
DOIs
Publication statusPublished - 2021 Apr

Bibliographical note

Funding Information:
Manuscript received October 12, 2020; accepted October 29, 2020. Date of publication November 2, 2020; date of current version March 26, 2021. This work was supported by the Samsung Electronics Company Ltd., Hwaseong, South Korea. This brief was recommended by Associate Editor B.-H. Gwee. (Corresponding author: Seong-Ook Jung.) Kiryong Kim, Ji Young Kim, and Seong-Ook Jung are with the School of Electrical and Electronic Engineering, Yonsei University, Seoul 03722, South Korea (e-mail: sjung@yonsei.ac.kr).

Publisher Copyright:
© 2004-2012 IEEE.

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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