A Bidirectional Neural Interface Circuit with Active Stimulation Artifact Cancellation and Cross-Channel Common-Mode Noise Suppression

Adam E. Mendrela, Jihyun Cho, Jeffrey A. Fredenburg, Vivek Nagaraj, Theoden I. Netoff, Michael P. Flynn, Euisik Yoon

Research output: Contribution to journalArticle

26 Citations (Scopus)

Abstract

This work presents a bidirectional neural interface circuit that enables simultaneous recording and stimulation with a stimulation artifact cancellation circuit. The system employs a common average referencing (CAR) front-end circuit to suppress cross-channel environmental noise to further facilitate use in clinical environment. This paper also introduces a new range-adapting (RA) SAR ADC to lower the system power consumption. A prototype is fabricated in 0.18 μm CMOS and characterized and tested in vivo in an epileptic rat model. The prototype attenuates stimulation artifacts by up to 42 dB and suppresses cross-channel noise by up to 39.8 dB. The measured power consumption per channel is 330 nW, while the area per channel is 0.17 mm2.

Original languageEnglish
Article number7370773
Pages (from-to)955-965
Number of pages11
JournalIEEE Journal of Solid-State Circuits
Volume51
Issue number4
DOIs
Publication statusPublished - 2016 Apr

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Networks (circuits)
Electric power utilization
Rats

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Mendrela, Adam E. ; Cho, Jihyun ; Fredenburg, Jeffrey A. ; Nagaraj, Vivek ; Netoff, Theoden I. ; Flynn, Michael P. ; Yoon, Euisik. / A Bidirectional Neural Interface Circuit with Active Stimulation Artifact Cancellation and Cross-Channel Common-Mode Noise Suppression. In: IEEE Journal of Solid-State Circuits. 2016 ; Vol. 51, No. 4. pp. 955-965.
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A Bidirectional Neural Interface Circuit with Active Stimulation Artifact Cancellation and Cross-Channel Common-Mode Noise Suppression. / Mendrela, Adam E.; Cho, Jihyun; Fredenburg, Jeffrey A.; Nagaraj, Vivek; Netoff, Theoden I.; Flynn, Michael P.; Yoon, Euisik.

In: IEEE Journal of Solid-State Circuits, Vol. 51, No. 4, 7370773, 04.2016, p. 955-965.

Research output: Contribution to journalArticle

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