A BIST architecture for multiple DACs in an LTPS TFT-LCD source driver IC

Hyeonuk Son, Jaewon Jang, Youbean Kim, Kicheol Kim, Incheol Kim, Sungho Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

The proposed built-in self-test(BIST) architecture aims at multiple digital-to-analog converters (DACs) in a low temperature poly-silicon(LTPS) based thin-film transistor liquid crystal display(TFT-LCD) source driver IC. DACs play an important role in display driver ICs(DDIs), so the proposed BIST is indispensable for DDIs' testing. The proposed BIST can compute differential non-linearity(DNL), integral nonlinearity(INL) and timing errors using some basic modules. The proposed architecture benefits the hardware overhead and the test application time without the loss of test quality. The validity and the effectiveness of the proposed method are verified through HSPICE simulations with an LTPS process.

Original languageEnglish
Title of host publication2009 International SoC Design Conference, ISOCC 2009
Pages120-123
Number of pages4
DOIs
Publication statusPublished - 2009 Dec 1
Event2009 International SoC Design Conference, ISOCC 2009 - Busan, Korea, Republic of
Duration: 2009 Nov 222009 Nov 24

Other

Other2009 International SoC Design Conference, ISOCC 2009
CountryKorea, Republic of
CityBusan
Period09/11/2209/11/24

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All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Son, H., Jang, J., Kim, Y., Kim, K., Kim, I., & Kang, S. (2009). A BIST architecture for multiple DACs in an LTPS TFT-LCD source driver IC. In 2009 International SoC Design Conference, ISOCC 2009 (pp. 120-123). [5423890] https://doi.org/10.1109/SOCDC.2009.5423890