A BIST architecture for multiple DACs in an LTPS TFT-LCD source driver IC

Hyeonuk Son; Jaewon Jang; Youbean Kim; Kicheol Kim; Incheol Kim; Sungho Kang

doi:10.1109/SOCDC.2009.5423890

A BIST architecture for multiple DACs in an LTPS TFT-LCD source driver IC

Hyeonuk Son, Jaewon Jang, Youbean Kim, Kicheol Kim, Incheol Kim, Sungho Kang

Department of Electrical and Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Citations (Scopus)

Abstract

The proposed built-in self-test(BIST) architecture aims at multiple digital-to-analog converters (DACs) in a low temperature poly-silicon(LTPS) based thin-film transistor liquid crystal display(TFT-LCD) source driver IC. DACs play an important role in display driver ICs(DDIs), so the proposed BIST is indispensable for DDIs' testing. The proposed BIST can compute differential non-linearity(DNL), integral nonlinearity(INL) and timing errors using some basic modules. The proposed architecture benefits the hardware overhead and the test application time without the loss of test quality. The validity and the effectiveness of the proposed method are verified through HSPICE simulations with an LTPS process.

Original language	English
Title of host publication	2009 International SoC Design Conference, ISOCC 2009
Pages	120-123
Number of pages	4
DOIs	https://doi.org/10.1109/SOCDC.2009.5423890
Publication status	Published - 2009
Event	2009 International SoC Design Conference, ISOCC 2009 - Busan, Korea, Republic of Duration: 2009 Nov 22 → 2009 Nov 24

Publication series

Name	2009 International SoC Design Conference, ISOCC 2009

Other

Other	2009 International SoC Design Conference, ISOCC 2009
Country/Territory	Korea, Republic of
City	Busan
Period	09/11/22 → 09/11/24

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering

Access to Document

10.1109/SOCDC.2009.5423890

Cite this

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title = "A BIST architecture for multiple DACs in an LTPS TFT-LCD source driver IC",

abstract = "The proposed built-in self-test(BIST) architecture aims at multiple digital-to-analog converters (DACs) in a low temperature poly-silicon(LTPS) based thin-film transistor liquid crystal display(TFT-LCD) source driver IC. DACs play an important role in display driver ICs(DDIs), so the proposed BIST is indispensable for DDIs' testing. The proposed BIST can compute differential non-linearity(DNL), integral nonlinearity(INL) and timing errors using some basic modules. The proposed architecture benefits the hardware overhead and the test application time without the loss of test quality. The validity and the effectiveness of the proposed method are verified through HSPICE simulations with an LTPS process.",

author = "Hyeonuk Son and Jaewon Jang and Youbean Kim and Kicheol Kim and Incheol Kim and Sungho Kang",

year = "2009",

doi = "10.1109/SOCDC.2009.5423890",

language = "English",

isbn = "9781424450343",

series = "2009 International SoC Design Conference, ISOCC 2009",

pages = "120--123",

booktitle = "2009 International SoC Design Conference, ISOCC 2009",

note = "2009 International SoC Design Conference, ISOCC 2009 ; Conference date: 22-11-2009 Through 24-11-2009",

}

Son, H, Jang, J, Kim, Y, Kim, K, Kim, I & Kang, S 2009, A BIST architecture for multiple DACs in an LTPS TFT-LCD source driver IC. in 2009 International SoC Design Conference, ISOCC 2009., 5423890, 2009 International SoC Design Conference, ISOCC 2009, pp. 120-123, 2009 International SoC Design Conference, ISOCC 2009, Busan, Korea, Republic of, 09/11/22. https://doi.org/10.1109/SOCDC.2009.5423890

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AU - Son, Hyeonuk

AU - Jang, Jaewon

AU - Kim, Youbean

AU - Kim, Kicheol

AU - Kim, Incheol

AU - Kang, Sungho

PY - 2009

Y1 - 2009

N2 - The proposed built-in self-test(BIST) architecture aims at multiple digital-to-analog converters (DACs) in a low temperature poly-silicon(LTPS) based thin-film transistor liquid crystal display(TFT-LCD) source driver IC. DACs play an important role in display driver ICs(DDIs), so the proposed BIST is indispensable for DDIs' testing. The proposed BIST can compute differential non-linearity(DNL), integral nonlinearity(INL) and timing errors using some basic modules. The proposed architecture benefits the hardware overhead and the test application time without the loss of test quality. The validity and the effectiveness of the proposed method are verified through HSPICE simulations with an LTPS process.

AB - The proposed built-in self-test(BIST) architecture aims at multiple digital-to-analog converters (DACs) in a low temperature poly-silicon(LTPS) based thin-film transistor liquid crystal display(TFT-LCD) source driver IC. DACs play an important role in display driver ICs(DDIs), so the proposed BIST is indispensable for DDIs' testing. The proposed BIST can compute differential non-linearity(DNL), integral nonlinearity(INL) and timing errors using some basic modules. The proposed architecture benefits the hardware overhead and the test application time without the loss of test quality. The validity and the effectiveness of the proposed method are verified through HSPICE simulations with an LTPS process.

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U2 - 10.1109/SOCDC.2009.5423890

DO - 10.1109/SOCDC.2009.5423890

M3 - Conference contribution

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T3 - 2009 International SoC Design Conference, ISOCC 2009

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BT - 2009 International SoC Design Conference, ISOCC 2009

T2 - 2009 International SoC Design Conference, ISOCC 2009

Y2 - 22 November 2009 through 24 November 2009

ER -

A BIST architecture for multiple DACs in an LTPS TFT-LCD source driver IC

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