A Built-in redundancy analysis with a minimized binary search tree

Hyungjun Cho, Wooheon Kang, Sungho Kang

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

With the growth of memory capacity and density, memory testing and repair with the goal of yield improvement have become more important. Therefore, the development of high efficiency redundancy analysis algorithms is essential to improve yield rate. In this letter, we propose an improved builtin redundancy analysis (BIRA) algorithm with a minimized binary search tree made by simple calculations. The tree is constructed until finding a solution from the most probable branch. This greatly reduces the search spaces for a solution. The proposed BIRA algorithm results in 100% repair efficiency and fast redundancy analysis.

Original languageEnglish
Pages (from-to)638-641
Number of pages4
JournalETRI Journal
Volume32
Issue number4
DOIs
Publication statusPublished - 2010 Aug 1

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Computer Science(all)
  • Electrical and Electronic Engineering

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