A clustered RIN BIST based on signal probabilities of deterministic test sets

Dong Sup Song, Sungho Kang

Research output: Contribution to journalArticle

Abstract

In this paper, we propose a new clustered reconfigurable interconnect network (CRIN) BIST that can improve the embedding probabilities of random-pattern-resistant-patterns. A simulated annealing based algorithm that maximizes the embedding probabilities of scan test cubes has been developed to reorder scan cells. Experimental results demonstrate that the proposed CRIN BIST technique reduces test time by 35% and the storage requirement by 39% in comparison with previous work.

Original languageEnglish
Pages (from-to)354-357
Number of pages4
JournalIEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
VolumeE89-A
Issue number1
DOIs
Publication statusPublished - 2006 Jan 1

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Built-in self test
Test Set
Interconnect
Simulated annealing
Simulated Annealing
Regular hexahedron
Maximise
Requirements
Cell
Experimental Results
Demonstrate

All Science Journal Classification (ASJC) codes

  • Signal Processing
  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering
  • Applied Mathematics

Cite this

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