A DFT controller for instruction-based functional test

Hong Sik Kim; Yong Chun Kim; Sungho Kang

A DFT controller for instruction-based functional test

Hong Sik Kim, Yong Chun Kim, Sungho Kang

Department of Electrical and Electronic Engineering

Research output: Contribution to journal › Letter › peer-review

Abstract

This paper presents a DFT controller called as a TCU (Test Control Unit), which considerably improves the efficiency of the instruction-based functional test. Internal program/data buses are completely controllable and observable by the TCU during the test cycle. Diverse test modes of the TCU can increase the test efficiency and also provide complete access to program/data memories for functional test.

Original language	English
Pages (from-to)	2070-2072
Number of pages	3
Journal	IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
Volume	E84-A
Issue number	8
Publication status	Published - 2001 Aug

All Science Journal Classification (ASJC) codes

Signal Processing
Computer Graphics and Computer-Aided Design
Electrical and Electronic Engineering
Applied Mathematics

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