A DFT controller for instruction-based functional test

Hong Sik Kim, Yong Chun Kim, Sungho Kang

Research output: Contribution to journalLetter

Abstract

This paper presents a DFT controller called as a TCU (Test Control Unit), which considerably improves the efficiency of the instruction-based functional test. Internal program/data buses are completely controllable and observable by the TCU during the test cycle. Diverse test modes of the TCU can increase the test efficiency and also provide complete access to program/data memories for functional test.

Original languageEnglish
Pages (from-to)2070-2072
Number of pages3
JournalIEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
VolumeE84-A
Issue number8
Publication statusPublished - 2001 Jan 1

    Fingerprint

All Science Journal Classification (ASJC) codes

  • Signal Processing
  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering
  • Applied Mathematics

Cite this