Abstract
This paper presents a DFT controller called as a TCU (Test Control Unit), which considerably improves the efficiency of the instruction-based functional test. Internal program/data buses are completely controllable and observable by the TCU during the test cycle. Diverse test modes of the TCU can increase the test efficiency and also provide complete access to program/data memories for functional test.
| Original language | English |
|---|---|
| Pages (from-to) | 2070-2072 |
| Number of pages | 3 |
| Journal | IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences |
| Volume | E84-A |
| Issue number | 8 |
| Publication status | Published - 2001 Jan 1 |
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All Science Journal Classification (ASJC) codes
- Signal Processing
- Computer Graphics and Computer-Aided Design
- Electrical and Electronic Engineering
- Applied Mathematics
Cite this
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A DFT controller for instruction-based functional test. / Kim, Hong Sik; Kim, Yong Chun; Kang, Sungho.
In: IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences, Vol. E84-A, No. 8, 01.01.2001, p. 2070-2072.Research output: Contribution to journal › Letter
TY - JOUR
T1 - A DFT controller for instruction-based functional test
AU - Kim, Hong Sik
AU - Kim, Yong Chun
AU - Kang, Sungho
PY - 2001/1/1
Y1 - 2001/1/1
N2 - This paper presents a DFT controller called as a TCU (Test Control Unit), which considerably improves the efficiency of the instruction-based functional test. Internal program/data buses are completely controllable and observable by the TCU during the test cycle. Diverse test modes of the TCU can increase the test efficiency and also provide complete access to program/data memories for functional test.
AB - This paper presents a DFT controller called as a TCU (Test Control Unit), which considerably improves the efficiency of the instruction-based functional test. Internal program/data buses are completely controllable and observable by the TCU during the test cycle. Diverse test modes of the TCU can increase the test efficiency and also provide complete access to program/data memories for functional test.
UR - http://www.scopus.com/inward/record.url?scp=0035421201&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0035421201&partnerID=8YFLogxK
M3 - Letter
AN - SCOPUS:0035421201
VL - E84-A
SP - 2070
EP - 2072
JO - IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
JF - IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
SN - 0916-8508
IS - 8
ER -