A Fast, Accurate and Widely Applicable Computer Algorithm for Estimating Layer Number of Two-Dimensional Materials

Seungwan Cho, Jekwan Lee, Soohyun Park, Hyemin Bae, Minji Noh, Beom Kim, Chihun In, Seung Hoon Yang, Sooun Lee, Seung Young Seo, Jehyun Kim, Chul Ho Lee, Wooyoung Shim, Moon Ho Jo, Dohun Kim, Hyunyong Choi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present a computer algorithm for layer number estimation of few-layered two-dimensional materials. Based on the optical contrast method, this algorithm analyzes an optical microscope image in a few seconds with high accuracy over 90%.

Original languageEnglish
Title of host publication2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781943580422
Publication statusPublished - 2018 Aug 6
Event2018 Conference on Lasers and Electro-Optics, CLEO 2018 - San Jose, United States
Duration: 2018 May 132018 May 18

Publication series

Name2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings

Other

Other2018 Conference on Lasers and Electro-Optics, CLEO 2018
CountryUnited States
CitySan Jose
Period18/5/1318/5/18

Fingerprint

estimating
optical microscopes
Microscopes

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

Cite this

Cho, S., Lee, J., Park, S., Bae, H., Noh, M., Kim, B., ... Choi, H. (2018). A Fast, Accurate and Widely Applicable Computer Algorithm for Estimating Layer Number of Two-Dimensional Materials. In 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings [8427021] (2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings). Institute of Electrical and Electronics Engineers Inc..
Cho, Seungwan ; Lee, Jekwan ; Park, Soohyun ; Bae, Hyemin ; Noh, Minji ; Kim, Beom ; In, Chihun ; Yang, Seung Hoon ; Lee, Sooun ; Seo, Seung Young ; Kim, Jehyun ; Lee, Chul Ho ; Shim, Wooyoung ; Jo, Moon Ho ; Kim, Dohun ; Choi, Hyunyong. / A Fast, Accurate and Widely Applicable Computer Algorithm for Estimating Layer Number of Two-Dimensional Materials. 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2018. (2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings).
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title = "A Fast, Accurate and Widely Applicable Computer Algorithm for Estimating Layer Number of Two-Dimensional Materials",
abstract = "We present a computer algorithm for layer number estimation of few-layered two-dimensional materials. Based on the optical contrast method, this algorithm analyzes an optical microscope image in a few seconds with high accuracy over 90{\%}.",
author = "Seungwan Cho and Jekwan Lee and Soohyun Park and Hyemin Bae and Minji Noh and Beom Kim and Chihun In and Yang, {Seung Hoon} and Sooun Lee and Seo, {Seung Young} and Jehyun Kim and Lee, {Chul Ho} and Wooyoung Shim and Jo, {Moon Ho} and Dohun Kim and Hyunyong Choi",
year = "2018",
month = "8",
day = "6",
language = "English",
isbn = "9781943580422",
series = "2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings",
address = "United States",

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Cho, S, Lee, J, Park, S, Bae, H, Noh, M, Kim, B, In, C, Yang, SH, Lee, S, Seo, SY, Kim, J, Lee, CH, Shim, W, Jo, MH, Kim, D & Choi, H 2018, A Fast, Accurate and Widely Applicable Computer Algorithm for Estimating Layer Number of Two-Dimensional Materials. in 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings., 8427021, 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings, Institute of Electrical and Electronics Engineers Inc., 2018 Conference on Lasers and Electro-Optics, CLEO 2018, San Jose, United States, 18/5/13.

A Fast, Accurate and Widely Applicable Computer Algorithm for Estimating Layer Number of Two-Dimensional Materials. / Cho, Seungwan; Lee, Jekwan; Park, Soohyun; Bae, Hyemin; Noh, Minji; Kim, Beom; In, Chihun; Yang, Seung Hoon; Lee, Sooun; Seo, Seung Young; Kim, Jehyun; Lee, Chul Ho; Shim, Wooyoung; Jo, Moon Ho; Kim, Dohun; Choi, Hyunyong.

2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2018. 8427021 (2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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T1 - A Fast, Accurate and Widely Applicable Computer Algorithm for Estimating Layer Number of Two-Dimensional Materials

AU - Cho, Seungwan

AU - Lee, Jekwan

AU - Park, Soohyun

AU - Bae, Hyemin

AU - Noh, Minji

AU - Kim, Beom

AU - In, Chihun

AU - Yang, Seung Hoon

AU - Lee, Sooun

AU - Seo, Seung Young

AU - Kim, Jehyun

AU - Lee, Chul Ho

AU - Shim, Wooyoung

AU - Jo, Moon Ho

AU - Kim, Dohun

AU - Choi, Hyunyong

PY - 2018/8/6

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N2 - We present a computer algorithm for layer number estimation of few-layered two-dimensional materials. Based on the optical contrast method, this algorithm analyzes an optical microscope image in a few seconds with high accuracy over 90%.

AB - We present a computer algorithm for layer number estimation of few-layered two-dimensional materials. Based on the optical contrast method, this algorithm analyzes an optical microscope image in a few seconds with high accuracy over 90%.

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M3 - Conference contribution

AN - SCOPUS:85052588769

SN - 9781943580422

T3 - 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings

BT - 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings

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Cho S, Lee J, Park S, Bae H, Noh M, Kim B et al. A Fast, Accurate and Widely Applicable Computer Algorithm for Estimating Layer Number of Two-Dimensional Materials. In 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2018. 8427021. (2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings).