A fast built-in redundancy analysis for memories with optimal repair rate using a line-based search tree

Woosik Jeong, Ilkwon Kang, Kyowon Jin, Sungho Kang

Research output: Contribution to journalArticle

48 Citations (Scopus)

Abstract

With the growth of memory capacity and density, test cost and yield improvement are becoming more important. In the case of embedded memories for systems-on-a-chip (SOC), built-in redundancy analysis (BIRA) is widely used as a solution to solve quality and yield issues by replacing faulty cells with extra good cells. However, previous BIRA approaches focused mainly on embedded memories rather than commodity memories. Many BIRA approaches require extra hardware overhead to achieve the optimal repair rate, which means that 100% of solution detection is guaranteed for intrinsically repairable dies, or they suffer a loss of repair rate to minimize the hardware overhead. In order to achieve both low area overhead and optimal repair rate, a novel BIRA approach is proposed and it builds a line-based searching tree. The proposed BIRA minimizes the storage capacity requirements to store faulty address information by dropping all unnecessary faulty addresses for inherently repairable die. The proposed BIRA analyzes redundancies quickly and efficiently with optimal repair rate by using a selected fail count comparison algorithm. Experimental results show that the proposed BIRA achieves optimal repair rate, fast analysis speed, and nearly optimal repair solutions with a relatively small area overhead.

Original languageEnglish
Article number4801554
Pages (from-to)1665-1678
Number of pages14
JournalIEEE Transactions on Very Large Scale Integration (VLSI) Systems
Volume17
Issue number12
DOIs
Publication statusPublished - 2009 Dec 1

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Redundancy
Repair
Data storage equipment
Computer hardware
Hardware
Costs

All Science Journal Classification (ASJC) codes

  • Software
  • Hardware and Architecture
  • Electrical and Electronic Engineering

Cite this

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A fast built-in redundancy analysis for memories with optimal repair rate using a line-based search tree. / Jeong, Woosik; Kang, Ilkwon; Jin, Kyowon; Kang, Sungho.

In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Vol. 17, No. 12, 4801554, 01.12.2009, p. 1665-1678.

Research output: Contribution to journalArticle

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