A flexible programmable memory BIST for embedded single-port memory and dual-port memory

Youngkyu Park, Hong Sik Kim, Inhyuk Choi, Sungho Kang

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

Programmable memory built-in self-test (PMBIST) is an attractive approach for testing embedded memory. However, the main difficulties of the previous works are the large area overhead and low flexibility. To overcome these problems, a new flexible PMBIST (FPMBIST) architecture that can test both single-port memory and dual-port memory using various test algorithms is proposed. In the FPMBIST, a new instruction set is developed to minimize the FPMBIST area overhead and to maximize the flexibility. In addition, FPMBIST includes a diagnostic scheme that can improve the yield by supporting three types of diagnostic methods for repair and diagnosis. The experiment results show that the proposed FPMBIST has small area overhead despite the fact that it supports various test algorithms, thus having high flexibility.

Original languageEnglish
Pages (from-to)808-818
Number of pages11
JournalETRI Journal
Volume35
Issue number5
DOIs
Publication statusPublished - 2013 Oct

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Computer Science(all)
  • Electrical and Electronic Engineering

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