TY - GEN
T1 - A framework for empirical classifiers comparison
AU - Abdullah, Mohammad Ridzuan Bin
AU - Toh, Kar Ann
AU - Srinivasan, Dipti
PY - 2006
Y1 - 2006
N2 - In this paper, we seek to establish a framework for empirical comparison of performance of pattern classifiers, allowing comparisons to be made consistently across different studies. As many as 106 datasets from the University of California, Irvine, Machine Learning Repository were used as comparison benchmarks. The framework provides a clear definition of the experimental setup so that it can be unambiguously reproduced or verified by others. Multiple runs of cross-validation and tuning were employed to minimize the possibility of random effects causing much biases in the results obtained. The metrics used to compare among different classifiers are based solely on simple readings obtained through classification tests. This allows future comparisons to be made readily adaptable for inclusion of new metrics.
AB - In this paper, we seek to establish a framework for empirical comparison of performance of pattern classifiers, allowing comparisons to be made consistently across different studies. As many as 106 datasets from the University of California, Irvine, Machine Learning Repository were used as comparison benchmarks. The framework provides a clear definition of the experimental setup so that it can be unambiguously reproduced or verified by others. Multiple runs of cross-validation and tuning were employed to minimize the possibility of random effects causing much biases in the results obtained. The metrics used to compare among different classifiers are based solely on simple readings obtained through classification tests. This allows future comparisons to be made readily adaptable for inclusion of new metrics.
UR - http://www.scopus.com/inward/record.url?scp=42749098742&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=42749098742&partnerID=8YFLogxK
U2 - 10.1109/ICIEA.2006.257073
DO - 10.1109/ICIEA.2006.257073
M3 - Conference contribution
AN - SCOPUS:42749098742
SN - 078039514X
SN - 9780780395145
T3 - 2006 1st IEEE Conference on Industrial Electronics and Applications
BT - 2006 1st IEEE Conference on Industrial Electronics and Applications
T2 - 2006 1st IEEE Conference on Industrial Electronics and Applications, ICIEA 2006
Y2 - 24 May 2006 through 26 May 2006
ER -