Abstract
Three dimensional integrated circuits (3D ICs) have been proposed as a solution for the limitation of microfabrication technology. However, through-silicon via (TSV), which connects two different dies vertically, may fail, and it can decrease the yield of 3D-ICs. A novel TSV repair architecture to repair defect TSVs is proposed in this paper. By shifting the corresponding signals of the faulty TSVs vertically and diagonally to the non-faulty TSVs, the proposed method maintains repair rate of TSV to 88.6% when there are 8 faulty TSVs. The hardware area of MUXs in proposed method is 193.6 μm2while that of the previous work is 245.8 μm2and 297.9
Original language | English |
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Title of host publication | Proceedings - 2019 International SoC Design Conference, ISOCC 2019 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 63-64 |
Number of pages | 2 |
ISBN (Electronic) | 9781728124780 |
DOIs | |
Publication status | Published - 2019 Oct |
Event | 16th International System-on-Chip Design Conference, ISOCC 2019 - Jeju, Korea, Republic of Duration: 2019 Oct 6 → 2019 Oct 9 |
Publication series
Name | Proceedings - 2019 International SoC Design Conference, ISOCC 2019 |
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Volume | 2019-January |
Conference
Conference | 16th International System-on-Chip Design Conference, ISOCC 2019 |
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Country/Territory | Korea, Republic of |
City | Jeju |
Period | 19/10/6 → 19/10/9 |
Bibliographical note
Funding Information:ACKNOWLEDGMENT This work was supported by the National Research Foundation of Korea(NRF) grant funded by the Korea government(MSIT) (No. 2019R1A2C3011079).
Publisher Copyright:
© 2021 IEEE.
All Science Journal Classification (ASJC) codes
- Signal Processing
- Electrical and Electronic Engineering
- Instrumentation
- Artificial Intelligence
- Hardware and Architecture