A hardware-efficient TSV repair scheme based on butterfly topology

Minho Cheong, Hyunyul Lim, Taehyun Kim, Sungho Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Three dimensional integrated circuits (3D ICs) have been proposed as a solution for the limitation of microfabrication technology. However, through-silicon via (TSV), which connects two different dies vertically, may fail, and it can decrease the yield of 3D-ICs. A novel TSV repair architecture to repair defect TSVs is proposed in this paper. By shifting the corresponding signals of the faulty TSVs vertically and diagonally to the non-faulty TSVs, the proposed method maintains repair rate of TSV to 88.6% when there are 8 faulty TSVs. The hardware area of MUXs in proposed method is 193.6 μm2while that of the previous work is 245.8 μm2and 297.9

Original languageEnglish
Title of host publicationProceedings - 2019 International SoC Design Conference, ISOCC 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages63-64
Number of pages2
ISBN (Electronic)9781728124780
DOIs
Publication statusPublished - 2019 Oct
Event16th International System-on-Chip Design Conference, ISOCC 2019 - Jeju, Korea, Republic of
Duration: 2019 Oct 62019 Oct 9

Publication series

NameProceedings - 2019 International SoC Design Conference, ISOCC 2019
Volume2019-January

Conference

Conference16th International System-on-Chip Design Conference, ISOCC 2019
Country/TerritoryKorea, Republic of
CityJeju
Period19/10/619/10/9

Bibliographical note

Funding Information:
ACKNOWLEDGMENT This work was supported by the National Research Foundation of Korea(NRF) grant funded by the Korea government(MSIT) (No. 2019R1A2C3011079).

Publisher Copyright:
© 2021 IEEE.

All Science Journal Classification (ASJC) codes

  • Signal Processing
  • Electrical and Electronic Engineering
  • Instrumentation
  • Artificial Intelligence
  • Hardware and Architecture

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