A heuristic for multiple weight set generation

H. S. Kim, J. K. Lee, Sungho Kang

Research output: Contribution to conferencePaper

3 Citations (Scopus)

Abstract

The number of weighted random patterns depends on the number of deterministic test patterns with a low sampling probability. The weight set that is extracted from the deterministic pattern set with high sampling probability reduces the number of test patterns. In the basis, in this paper we present a new deterministic pattern selection algorithm which generates high performance weight sets by removing deterministic patterns with low sampling frequencies. Simulation results using ISCAS 85 benchmark circuits prove the effectiveness of the new weight set generation algorithm.

Original languageEnglish
Pages513-514
Number of pages2
Publication statusPublished - 2001 Jan 1
EventIEEE International Conference on: Computer Design: VLSI in Computers and Processors (ICCD 2001) - Austin, TX, United States
Duration: 2001 Sep 232001 Sep 26

Other

OtherIEEE International Conference on: Computer Design: VLSI in Computers and Processors (ICCD 2001)
CountryUnited States
CityAustin, TX
Period01/9/2301/9/26

Fingerprint

Sampling
Networks (circuits)

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering

Cite this

Kim, H. S., Lee, J. K., & Kang, S. (2001). A heuristic for multiple weight set generation. 513-514. Paper presented at IEEE International Conference on: Computer Design: VLSI in Computers and Processors (ICCD 2001), Austin, TX, United States.
Kim, H. S. ; Lee, J. K. ; Kang, Sungho. / A heuristic for multiple weight set generation. Paper presented at IEEE International Conference on: Computer Design: VLSI in Computers and Processors (ICCD 2001), Austin, TX, United States.2 p.
@conference{e3c4d2a9e053484dbe66c9a88a4497a9,
title = "A heuristic for multiple weight set generation",
abstract = "The number of weighted random patterns depends on the number of deterministic test patterns with a low sampling probability. The weight set that is extracted from the deterministic pattern set with high sampling probability reduces the number of test patterns. In the basis, in this paper we present a new deterministic pattern selection algorithm which generates high performance weight sets by removing deterministic patterns with low sampling frequencies. Simulation results using ISCAS 85 benchmark circuits prove the effectiveness of the new weight set generation algorithm.",
author = "Kim, {H. S.} and Lee, {J. K.} and Sungho Kang",
year = "2001",
month = "1",
day = "1",
language = "English",
pages = "513--514",
note = "IEEE International Conference on: Computer Design: VLSI in Computers and Processors (ICCD 2001) ; Conference date: 23-09-2001 Through 26-09-2001",

}

Kim, HS, Lee, JK & Kang, S 2001, 'A heuristic for multiple weight set generation' Paper presented at IEEE International Conference on: Computer Design: VLSI in Computers and Processors (ICCD 2001), Austin, TX, United States, 01/9/23 - 01/9/26, pp. 513-514.

A heuristic for multiple weight set generation. / Kim, H. S.; Lee, J. K.; Kang, Sungho.

2001. 513-514 Paper presented at IEEE International Conference on: Computer Design: VLSI in Computers and Processors (ICCD 2001), Austin, TX, United States.

Research output: Contribution to conferencePaper

TY - CONF

T1 - A heuristic for multiple weight set generation

AU - Kim, H. S.

AU - Lee, J. K.

AU - Kang, Sungho

PY - 2001/1/1

Y1 - 2001/1/1

N2 - The number of weighted random patterns depends on the number of deterministic test patterns with a low sampling probability. The weight set that is extracted from the deterministic pattern set with high sampling probability reduces the number of test patterns. In the basis, in this paper we present a new deterministic pattern selection algorithm which generates high performance weight sets by removing deterministic patterns with low sampling frequencies. Simulation results using ISCAS 85 benchmark circuits prove the effectiveness of the new weight set generation algorithm.

AB - The number of weighted random patterns depends on the number of deterministic test patterns with a low sampling probability. The weight set that is extracted from the deterministic pattern set with high sampling probability reduces the number of test patterns. In the basis, in this paper we present a new deterministic pattern selection algorithm which generates high performance weight sets by removing deterministic patterns with low sampling frequencies. Simulation results using ISCAS 85 benchmark circuits prove the effectiveness of the new weight set generation algorithm.

UR - http://www.scopus.com/inward/record.url?scp=0035183733&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0035183733&partnerID=8YFLogxK

M3 - Paper

SP - 513

EP - 514

ER -

Kim HS, Lee JK, Kang S. A heuristic for multiple weight set generation. 2001. Paper presented at IEEE International Conference on: Computer Design: VLSI in Computers and Processors (ICCD 2001), Austin, TX, United States.