A heuristic method to reduce fault candidates for a speedy fault diagnosis

Hyungjun Cho, Joohwan Lee, Sungho Kang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper, we present a heuristic method to reduce fault candidates for an efficient fault diagnosis. This paper uses a matching algorithm for the exact fault diagnosis. But the time consumption of a fault diagnosis using the matching algorithm is huge. So, we present a new method to reduce the fault diagnosis time. The method to reduce the time consumption is separated into two different phases which are a pattern comparison and a back-tracing comparison in failing pattern. The proposed method reduces fault candidates by comparing failing patterns with good patterns during critical path tracing process and comparing back-tracing from non-erroneous POs with backtracing erroneous POs. The proposed method increases the simulation speed than the conventional algorithms. And this method is also applicable to any other fault diagnosis algorithms. Experimental results on ISCAS'85 and ISCAS'89 benchmark circuits show that fault candidate lists are reduced than those of previous diagnosis methods.

Original languageEnglish
Title of host publication2008 International SoC Design Conference, ISOCC 2008
Volume1
DOIs
Publication statusPublished - 2008 Dec 1
Event2008 International SoC Design Conference, ISOCC 2008 - Busan, Korea, Republic of
Duration: 2008 Nov 242008 Nov 25

Other

Other2008 International SoC Design Conference, ISOCC 2008
CountryKorea, Republic of
CityBusan
Period08/11/2408/11/25

Fingerprint

Heuristic methods
Failure analysis
Networks (circuits)

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Software

Cite this

Cho, H., Lee, J., & Kang, S. (2008). A heuristic method to reduce fault candidates for a speedy fault diagnosis. In 2008 International SoC Design Conference, ISOCC 2008 (Vol. 1). [4815607] https://doi.org/10.1109/SOCDC.2008.4815607
Cho, Hyungjun ; Lee, Joohwan ; Kang, Sungho. / A heuristic method to reduce fault candidates for a speedy fault diagnosis. 2008 International SoC Design Conference, ISOCC 2008. Vol. 1 2008.
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Cho, H, Lee, J & Kang, S 2008, A heuristic method to reduce fault candidates for a speedy fault diagnosis. in 2008 International SoC Design Conference, ISOCC 2008. vol. 1, 4815607, 2008 International SoC Design Conference, ISOCC 2008, Busan, Korea, Republic of, 08/11/24. https://doi.org/10.1109/SOCDC.2008.4815607

A heuristic method to reduce fault candidates for a speedy fault diagnosis. / Cho, Hyungjun; Lee, Joohwan; Kang, Sungho.

2008 International SoC Design Conference, ISOCC 2008. Vol. 1 2008. 4815607.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Cho H, Lee J, Kang S. A heuristic method to reduce fault candidates for a speedy fault diagnosis. In 2008 International SoC Design Conference, ISOCC 2008. Vol. 1. 2008. 4815607 https://doi.org/10.1109/SOCDC.2008.4815607