A low-cost BIST based on histogram testing for analog to digital converters

Kicheol Kim, Youbean Kim, Incheol Kim, Hyeonuk Son, Sungho Kang

Research output: Contribution to journalArticle

1 Citation (Scopus)


In this letter a histogram-based BIST (Built-In Self-Test) approach for deriving the main characteristic parameters of an ADC (Analog to Digital Converter) such as offset, gain and non-linearities is proposed. The BIST uses a ramp signal as an input signal and two counters as a response analyzer to calculate the derived static parameters. Experimental results show that the proposed method reduces the hardware overhead and testing time while detecting any static faults in an ADC.

Original languageEnglish
Pages (from-to)670-672
Number of pages3
JournalIEICE Transactions on Electronics
Issue number4
Publication statusPublished - 2008 Apr


All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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