This paper presents for hardware-based parallel pattern matching scheme that adopts heterogeneous bit-split string matchers for deep packet inspection (DPI) devices. Considering the pattern lengths, a set of target patterns is partitioned into two subsets for short and long patterns. By adopting the appropriate bit-split string matcher types for the two subsets, the memory requirements can be optimized for the bit-split parallel pattern matching engine. Experimental results show that the total memory requirements decrease by 39.40% and 20.52%, in comparison with the existing bit-split pattern matching approaches.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering