A New Accelerated Endurance Test for Terabit NAND Flash Memory Using Interference Effect

Jaewon Cha, Wooheon Kang, Junsub Chung, Kunwoo Park, Sungho Kang

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

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Physics & Astronomy

Chemical Compounds

Engineering & Materials Science