A new BIST (Built-in Self-test) method for static ADC testing is proposed. The proposed method detects offset, gain, INL (Integral Non-linearity) and DNL (Differential Non-linearity) errors with a low hardware overhead. Moreover, it can solve a transient zone problem which is derived from the ADC noise in real test environments.
Bibliographical notePublisher Copyright:
© 2007 The Institute of Electronics, Information and Communication Engineers.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering