A new analog-to-digital converter BIST considering a transient zone

Incheol Kim, Kicheol Kim, Youbean Kim, Hyeonuk Son, Sungho Kang

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

A new BIST (Built-in Self-test) method for static ADC testing is proposed. The proposed method detects offset, gain, INL (Integral Non-linearity) and DNL (Differential Non-linearity) errors with a low hardware overhead. Moreover, it can solve a transient zone problem which is derived from the ADC noise in real test environments.

Original languageEnglish
Pages (from-to)2161-2163
Number of pages3
JournalIEICE Transactions on Electronics
VolumeE90C
Issue number11
DOIs
Publication statusPublished - 2007

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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