A new analog-to-digital converter BIST considering a transient zone

Engineering

• Nonlinearity 100%
• Built-in Self Test 100%
• Transients 100%
• Test Method 50%
• Test Environment 50%
• Analog-to-Digital Converter 50%
• Testing 50%
• Linearity Error 50%
• Integral Gain 50%

Computer Science

• Hardware Overhead 100%
• Test Environment 50%
• Analog-to-Digital Converter 50%
• Integral Gain 50%
• Testing 50%

Physics

• Region 100%
• Transients 100%
• Statics 50%