Abstract
A NAND flash system has been adopted as storage. However, due to its distinctive operation mechanisms, it endures only the limited number of program/Erase cycles. So, bad blocks are inevitably developed during the life time of the storage system. A bad block is a block that contains faulty bits that cannot be covered by ECC. In this paper, a novel in-field bad block detection scheme is proposed. Through simple write verifications, the proposed bad block detector finds bad blocks in real-time, and ensures that written data is reliable. The detection method includes neither costly data-mirroring nor complex ECC processing, but it requires an additional detection module of which size is less than 0.15% of the controller size.
| Original language | English |
|---|---|
| Title of host publication | ISOCC 2015 - International SoC Design Conference |
| Subtitle of host publication | SoC for Internet of Everything (IoE) |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 69-70 |
| Number of pages | 2 |
| ISBN (Electronic) | 9781467393089 |
| DOIs | |
| Publication status | Published - 2016 Feb 8 |
| Event | 12th International SoC Design Conference, ISOCC 2015 - Gyeongju, Korea, Republic of Duration: 2015 Nov 2 → 2015 Nov 5 |
Publication series
| Name | ISOCC 2015 - International SoC Design Conference: SoC for Internet of Everything (IoE) |
|---|
Other
| Other | 12th International SoC Design Conference, ISOCC 2015 |
|---|---|
| Country/Territory | Korea, Republic of |
| City | Gyeongju |
| Period | 15/11/2 → 15/11/5 |
Bibliographical note
Publisher Copyright:© 2015 IEEE.
All Science Journal Classification (ASJC) codes
- Hardware and Architecture
- Electrical and Electronic Engineering
- Electronic, Optical and Magnetic Materials